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Description
  • Testing methods, originally developed for luminescent diodes and other semiconductor devices was applied to an ensambles of solar cells. Quality of the devices is assessed according to forward and reverse V-I characteristic and noise voltage spectral density.
  • Testing methods, originally developed for luminescent diodes and other semiconductor devices was applied to an ensambles of solar cells. Quality of the devices is assessed according to forward and reverse V-I characteristic and noise voltage spectral density. (en)
Title
  • Utilization of Noise Characteristic for Quality Check of Solar Cells
  • Utilization of Noise Characteristic for Quality Check of Solar Cells (en)
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  • Utilization of Noise Characteristic for Quality Check of Solar Cells
  • Utilization of Noise Characteristic for Quality Check of Solar Cells (en)
skos:notation
  • RIV/00216305:26220/04:PU43594!RIV11-MSM-26220___
http://linked.open...avai/riv/aktivita
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  • V, Z(MSM 262200010)
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http://linked.open...aciTvurceVysledku
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  • 591863
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  • RIV/00216305:26220/04:PU43594
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  • diode, semiconductor, noise, spectral, density (en)
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  • [61E7F744CEC3]
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  • Brno
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  • Brno
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  • Proceedings of the 10th conference student eeict 2004
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http://linked.open...cetTvurcuVysledku
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http://linked.open...iv/tvurceVysledku
  • Brzokoupil, Vladimír
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http://linked.open.../riv/zahajeniAkce
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  • Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
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  • 80-214-2636-5
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  • 26220
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