| Attributes | Values |
|---|
| rdf:type
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| Description
| - Rastrovací optická mikroskopie v blízkém poli(SNOM) otevřela novou éru optické mikroskopie royzlišením 50-100 nm. Pomocí tohoto mikroskopu je možné současně topografii a lokální optické a elektronové vlastnosti, čímž se vyloučí nutnost korelační analýzyvýsledků. V článku budou diskutovány některé z aplikací SNOM ve spektroskopii, včetně předností a nedostatků. (cs)
- Scanning near-field optical microscopy (SNOM) opened a new era in optical microscopy, bringing the spatial resolution at the 50-100 nm level using visible or near infrared light. This resolution is well below the diffraction limit of light and allows to overcome the restrictions of classical (far-field) optical techniques. With the development of small-aperture optical fiber probes or apertureless probes, sub-wavelength resolutions were achieved. The single capability of SNOM to simultaneously measure surface topography and local optical and electronic properties, thereby eliminating the need to perform cross correlation analysis on results obtained using different techniques, is particularly useful in this area. Several applications to the characterization of semiconductor, where SNOM techniques make possible a direct access to nondestructive, non-contact spectroscopic investigation of the structures, will be discussed. The advantages and drawbacks of SNOM in each application will be highlighte
- Scanning near-field optical microscopy (SNOM) opened a new era in optical microscopy, bringing the spatial resolution at the 50-100 nm level using visible or near infrared light. This resolution is well below the diffraction limit of light and allows to overcome the restrictions of classical (far-field) optical techniques. With the development of small-aperture optical fiber probes or apertureless probes, sub-wavelength resolutions were achieved. The single capability of SNOM to simultaneously measure surface topography and local optical and electronic properties, thereby eliminating the need to perform cross correlation analysis on results obtained using different techniques, is particularly useful in this area. Several applications to the characterization of semiconductor, where SNOM techniques make possible a direct access to nondestructive, non-contact spectroscopic investigation of the structures, will be discussed. The advantages and drawbacks of SNOM in each application will be highlighte (en)
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| Title
| - Scanning near-field optical microscopy and its application in semiconductor investigation
- Scanning near-field optical microscopy and its application in semiconductor investigation (en)
- Rastrovací optická mikroskopie v blíykém poli a její aplikace v polvodičovém výzkumu (cs)
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| skos:prefLabel
| - Scanning near-field optical microscopy and its application in semiconductor investigation
- Scanning near-field optical microscopy and its application in semiconductor investigation (en)
- Rastrovací optická mikroskopie v blíykém poli a její aplikace v polvodičovém výzkumu (cs)
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| skos:notation
| - RIV/00216305:26220/04:PU42255!RIV/2005/MSM/262205/N
|
| http://linked.open.../vavai/riv/strany
| |
| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
| - P(ME 544), Z(MSM 262200022)
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| http://linked.open...vai/riv/dodaniDat
| |
| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
| |
| http://linked.open...iv/duvernostUdaju
| |
| http://linked.open...titaPredkladatele
| |
| http://linked.open...dnocenehoVysledku
| |
| http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/04:PU42255
|
| http://linked.open...riv/jazykVysledku
| |
| http://linked.open.../riv/klicovaSlova
| - scanning near-field optical microscopy, photoluminecsence, semiconductor, locally induced photocurrent (en)
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| http://linked.open.../riv/klicoveSlovo
| |
| http://linked.open...ontrolniKodProRIV
| |
| http://linked.open...v/mistoKonaniAkce
| |
| http://linked.open...i/riv/mistoVydani
| |
| http://linked.open...i/riv/nazevZdroje
| - Scanning probe microscopy 2004
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| http://linked.open...in/vavai/riv/obor
| |
| http://linked.open...ichTvurcuVysledku
| |
| http://linked.open...cetTvurcuVysledku
| |
| http://linked.open...vavai/riv/projekt
| |
| http://linked.open...UplatneniVysledku
| |
| http://linked.open...iv/tvurceVysledku
| - Tománek, Pavel
- Dobis, Pavel
- Otevřelová, Dana
- Benešová, Markéta
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| http://linked.open...vavai/riv/typAkce
| |
| http://linked.open.../riv/zahajeniAkce
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| http://linked.open...n/vavai/riv/zamer
| |
| number of pages
| |
| http://purl.org/ne...btex#hasPublisher
| - Institute for Physics of Microsctructures RAS
|
| http://localhost/t...ganizacniJednotka
| |
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