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rdf:type
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Description
| - Sledování bistabilního mechanismu vedení proudu v závěrně polarizovaných PN přechodech může být užito jako významného prostředku pro studium nehomogenit v těchto PN přechodech. (cs)
- Tracing the bi-stable mechanism of reverse-biased junction conductivity can be used as an efficient tool to study PN junction inhomegeneities. This conductivity mechanism is usually accounted for in terms of crystalline lattice imperfections, dislocations, or metallic precipitates in the PN junction region. Two methods have been suggested for practical application: first, a tentative method to distinguish between the bi-stable and the multi-stable conductivity mechanism, and, second, a noise current rmss value versus DC current plot based method.
- Tracing the bi-stable mechanism of reverse-biased junction conductivity can be used as an efficient tool to study PN junction inhomegeneities. This conductivity mechanism is usually accounted for in terms of crystalline lattice imperfections, dislocations, or metallic precipitates in the PN junction region. Two methods have been suggested for practical application: first, a tentative method to distinguish between the bi-stable and the multi-stable conductivity mechanism, and, second, a noise current rmss value versus DC current plot based method. (en)
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Title
| - Diagnostika PN přechodů GaAsP luminiscenčních diod (cs)
- Diagnostics of GaAsP Light Emitting Diode PN Junctions
- Diagnostics of GaAsP Light Emitting Diode PN Junctions (en)
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skos:prefLabel
| - Diagnostika PN přechodů GaAsP luminiscenčních diod (cs)
- Diagnostics of GaAsP Light Emitting Diode PN Junctions
- Diagnostics of GaAsP Light Emitting Diode PN Junctions (en)
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skos:notation
| - RIV/00216305:26220/03:PU42130!RIV06-GA0-26220___
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA102/03/0621), Z(MSM 262200022)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/03:PU42130
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - PN Junction, Microplasma noise, Quality, Avalanche breakdown (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, Abstracts Book
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Koktavý, Pavel
- Koktavý, Bohumil
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
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http://localhost/t...ganizacniJednotka
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