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Description
| - The lifetime local measurement of excess carriers in silicon samples are described. The work was performed with the implementation of scanning near-field optical microscopy (SNOM). We present here an alternative development of SNOM: its implementation as an imaging tool to study the dynamics of excess carriers in semiconductor devices. We concentrate on obtaining images for which the contrast mechanism is a time-dependent property of the sample, and attempt to relate them to important sample characterisstics.
- The lifetime local measurement of excess carriers in silicon samples are described. The work was performed with the implementation of scanning near-field optical microscopy (SNOM). We present here an alternative development of SNOM: its implementation as an imaging tool to study the dynamics of excess carriers in semiconductor devices. We concentrate on obtaining images for which the contrast mechanism is a time-dependent property of the sample, and attempt to relate them to important sample characterisstics. (en)
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Title
| - Time-resolved contrast in near-field scanning optical microscopy of semiconductors
- Time-resolved contrast in near-field scanning optical microscopy of semiconductors (en)
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skos:prefLabel
| - Time-resolved contrast in near-field scanning optical microscopy of semiconductors
- Time-resolved contrast in near-field scanning optical microscopy of semiconductors (en)
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skos:notation
| - RIV/00216305:26220/03:PU39859!RIV/2004/MSM/262204/N
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(ME 544), P(OC 523.40), Z(MSM 262200022)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/03:PU39859
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - near-field optical microscopy, semiconductor, local measurement, contrast, evaluation (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Proceedings of International conference Nano 03
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...ocetUcastnikuAkce
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http://linked.open...nichUcastnikuAkce
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Tománek, Pavel
- Dobis, Pavel
- Brüstlová, Jitka
- Benešová, Markéta
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - Vysoké učení technické v Brně. Fakulta strojního inženýrství
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https://schema.org/isbn
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http://localhost/t...ganizacniJednotka
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