About: Local optical imaging of electronic characteristics in semiconductors

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The continuous trend towards miniaturization of devices brings a new challenge for semiconductor studies: the demand for local rather than average material characterization. We report on optical imaging with superresolution in two different cases, which show the possibility of the Scanning Near-field Optical Microscopy (SNOM): dynamics of excess carriers in silicon and optically induced photocurrent in semiconductor structure The images locate defects, reveal variations, and also can map the regions in which a recombination process is active. Quantitative mapping of the excess carrier lifetime at sub-wavelength resolution better than 250 nm is now possible. Such measurements will give new insights into carrier transport and recombination processes in all types of semiconductors. On the other side, the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process is presente The continuous trend towards miniaturization of devices brings a new challenge for semiconductor studies: the demand for local rather than average material characterization. We report on optical imaging with superresolution in two different cases, which show the possibility of the Scanning Near-field Optical Microscopy (SNOM): dynamics of excess carriers in silicon and optically induced photocurrent in semiconductor structure The images locate defects, reveal variations, and also can map the regions in which a recombination process is active. Quantitative mapping of the excess carrier lifetime at sub-wavelength resolution better than 250 nm is now possible. Such measurements will give new insights into carrier transport and recombination processes in all types of semiconductors. On the other side, the comparative study of spatially resolved near-field photocurrent (NPC) spectra for high power laser diode arrays with double quantum well before and after degradation due to the aging process is presente (en)
Title	Local optical imaging of electronic characteristics in semiconductors Local optical imaging of electronic characteristics in semiconductors (en)
skos:prefLabel	Local optical imaging of electronic characteristics in semiconductors Local optical imaging of electronic characteristics in semiconductors (en)
skos:notation	RIV/00216305:26220/03:PU37385!RIV/2004/MSM/262204/N
http://linked.open.../vavai/riv/strany	445-448
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ME 544), P(OC 523.40), Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Otevřelová, Dana Dobisová, Markéta Tománek, Pavel Grmela, Lubomír Dobis, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	613737
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/03:PU37385
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	semiconductor, nanostructure, measurement, local characteristics (en)
http://linked.open.../riv/klicoveSlovo	measurement semiconductor local characteristics nanostructure
http://linked.open...ontrolniKodProRIV	[E2832B9FA9AA]
http://linked.open...v/mistoKonaniAkce	Prague
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Noise and fluctuation ICNF 2003
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	http://linked.opendata.cz/resource/domain/vavai/projekt/OC%20523.40 http://linked.opendata.cz/resource/domain/vavai/projekt/ME%20544
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Tománek, Pavel Dobis, Pavel Otevřelová, Dana Benešová, Markéta
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2003-08-18 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
https://schema.org/isbn	80-239-1005-1
http://localhost/t...ganizacniJednotka	26220

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