About: Near-field optical imaging of carrier dynamics in silicon with superresolution

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The lifetime of excess carriers created by illumination of a semiconductor with a visible light is modified by the presence of defects, which may occur under or in the surface. The system detects the excess carries with an infrared (IR) light. Due to the free carrier absorption as a dominant carrier interaction for used IR wavelength, the IR signal is decreased by the presence of excess carriers. The time-dependence of the IR signal variation is characteristic of the excess carrier lifetime. Characterisstic rate variations of carrier processes in silicon are imaged using near field scanning optical microscopy (NSOM) with high (<100 nm) spatial resolution. Moreover, the images can locate defects, reveal variations, and map the regions in which a recombination process is active. The lifetime of excess carriers created by illumination of a semiconductor with a visible light is modified by the presence of defects, which may occur under or in the surface. The system detects the excess carries with an infrared (IR) light. Due to the free carrier absorption as a dominant carrier interaction for used IR wavelength, the IR signal is decreased by the presence of excess carriers. The time-dependence of the IR signal variation is characteristic of the excess carrier lifetime. Characterisstic rate variations of carrier processes in silicon are imaged using near field scanning optical microscopy (NSOM) with high (<100 nm) spatial resolution. Moreover, the images can locate defects, reveal variations, and map the regions in which a recombination process is active. (en)
Title	Near-field optical imaging of carrier dynamics in silicon with superresolution Near-field optical imaging of carrier dynamics in silicon with superresolution (en)
skos:prefLabel	Near-field optical imaging of carrier dynamics in silicon with superresolution Near-field optical imaging of carrier dynamics in silicon with superresolution (en)
skos:notation	RIV/00216305:26220/03:PU31773!RIV/2004/MSM/262204/N
http://linked.open.../vavai/riv/strany	63-65
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ME 544), P(OC 523.40), Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Otevřelová, Dana Dobisová, Markéta Tománek, Pavel Grmela, Lubomír Dobis, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	617418
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/03:PU31773
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	near-field optics, optical imaging, superresolution, semiconductor, silicon, lifetime, carrier dynamics (en)
http://linked.open.../riv/klicoveSlovo	near-field optics lifetime optical imaging silicon superresolution semiconductor carrier dynamics
http://linked.open...ontrolniKodProRIV	[9076CB37676A]
http://linked.open...v/mistoKonaniAkce	Nizhniy Novgorod
http://linked.open...i/riv/mistoVydani	Nizhniy Novgorod, Russia
http://linked.open...i/riv/nazevZdroje	Scanning Probe Microscopy - 2003
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	http://linked.opendata.cz/resource/domain/vavai/projekt/OC%20523.40 http://linked.opendata.cz/resource/domain/vavai/projekt/ME%20544
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Tománek, Pavel Dobis, Pavel Otevřelová, Dana Benešová, Markéta
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2003-03-02 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
number of pages	3 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Institute for Physics of microstructures RAS
http://localhost/t...ganizacniJednotka	26220

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