About: Reverse Biased P-N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas

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About: Reverse Biased P-N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hass been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability density w(t0) of the impulse separation t0 and the probability density w(t1) of the impulse width t1 have exponential courses. The power spectral density of the noise current is of a G-R process type and depends on the particular microplasma properties. From the viewpoint of noise diagnostics, the most important features are the s Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hass been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability density w(t0) of the impulse separation t0 and the probability density w(t1) of the impulse width t1 have exponential courses. The power spectral density of the noise current is of a G-R process type and depends on the particular microplasma properties. From the viewpoint of noise diagnostics, the most important features are the s (en)
Title	Reverse Biased P-N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas Reverse Biased P-N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas (en)
skos:prefLabel	Reverse Biased P-N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas Reverse Biased P-N Junction Noise in GaAsP Diodes with Avalanche Breakdown Induced Microplasmas (en)
skos:notation	RIV/00216305:26220/02:PU30677!RIV/2003/MSM/262203/N
http://linked.open.../vavai/riv/strany	65-70
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM 262200022)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Koktavý, Pavel Šikula, Josef
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	662336
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/02:PU30677
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Microplasma noise, Local avalanche breakdown, LED diodes, Reliability (en)
http://linked.open.../riv/klicoveSlovo	Reliability LED diodes Local avalanche breakdown Microplasma noise
http://linked.open...odStatuVydavatele	SG - Singapurská republika
http://linked.open...ontrolniKodProRIV	[E9277CC0EF16]
http://linked.open...i/riv/nazevZdroje	Fluctuation and Noise Letters
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...UplatneniVysledku	2002
http://linked.open...v/svazekPeriodika	2
http://linked.open...iv/tvurceVysledku	Koktavý, Pavel Šikula, Josef
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
issn	0219-4775
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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