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Description
| - The paper deals with design of the automatic measurement of noise spectral density. Automatic, fully computer controling apparatus is built-up from suitable sensor, low-noise amplifier with setup gain and frequency band, appropriate analog-digital converter and evaluation software. The philosophy of the apparatus design is based on the fact that the degradation of any device which takes place during its operation is accompanied by irreversible changes in operational, transport and if any, for exampple in LED’s, optical characteristics. All these changes manifest a decreased device reliability. Ageing experiments show that the degradation is manifested through certain parameters, which are relatively easy to measure and proved to be closely correlated with the degradation. Reliability indicators employing operating, transport and stochastic characteristics of LED´s, whose relevance has been verified by our recent analysis, make a basis for the design of a reliability tester.
- The paper deals with design of the automatic measurement of noise spectral density. Automatic, fully computer controling apparatus is built-up from suitable sensor, low-noise amplifier with setup gain and frequency band, appropriate analog-digital converter and evaluation software. The philosophy of the apparatus design is based on the fact that the degradation of any device which takes place during its operation is accompanied by irreversible changes in operational, transport and if any, for exampple in LED’s, optical characteristics. All these changes manifest a decreased device reliability. Ageing experiments show that the degradation is manifested through certain parameters, which are relatively easy to measure and proved to be closely correlated with the degradation. Reliability indicators employing operating, transport and stochastic characteristics of LED´s, whose relevance has been verified by our recent analysis, make a basis for the design of a reliability tester. (en)
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Title
| - Noise Tester for Electronic Components
- Noise Tester for Electronic Components (en)
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skos:prefLabel
| - Noise Tester for Electronic Components
- Noise Tester for Electronic Components (en)
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skos:notation
| - RIV/00216305:26220/02:PU30661!RIV/2003/MSM/262203/N
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/02:PU30661
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - spectral density, noise spectroscopy, agening, reliability (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Noise and Non-linearity Testing of Modern Electronic Components - NNT
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...ocetUcastnikuAkce
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http://linked.open...nichUcastnikuAkce
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Grmela, Lubomír
- Koktavý, Pavel
- Pavelka, Jan
- Dobis, Pavel
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
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https://schema.org/isbn
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http://localhost/t...ganizacniJednotka
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