About: Noise Tester for Electronic Components

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The paper deals with design of the automatic measurement of noise spectral density. Automatic, fully computer controling apparatus is built-up from suitable sensor, low-noise amplifier with setup gain and frequency band, appropriate analog-digital converter and evaluation software. The philosophy of the apparatus design is based on the fact that the degradation of any device which takes place during its operation is accompanied by irreversible changes in operational, transport and if any, for exampple in LED’s, optical characteristics. All these changes manifest a decreased device reliability. Ageing experiments show that the degradation is manifested through certain parameters, which are relatively easy to measure and proved to be closely correlated with the degradation. Reliability indicators employing operating, transport and stochastic characteristics of LED´s, whose relevance has been verified by our recent analysis, make a basis for the design of a reliability tester. The paper deals with design of the automatic measurement of noise spectral density. Automatic, fully computer controling apparatus is built-up from suitable sensor, low-noise amplifier with setup gain and frequency band, appropriate analog-digital converter and evaluation software. The philosophy of the apparatus design is based on the fact that the degradation of any device which takes place during its operation is accompanied by irreversible changes in operational, transport and if any, for exampple in LED’s, optical characteristics. All these changes manifest a decreased device reliability. Ageing experiments show that the degradation is manifested through certain parameters, which are relatively easy to measure and proved to be closely correlated with the degradation. Reliability indicators employing operating, transport and stochastic characteristics of LED´s, whose relevance has been verified by our recent analysis, make a basis for the design of a reliability tester. (en)
Title	Noise Tester for Electronic Components Noise Tester for Electronic Components (en)
skos:prefLabel	Noise Tester for Electronic Components Noise Tester for Electronic Components (en)
skos:notation	RIV/00216305:26220/02:PU30661!RIV/2003/MSM/262203/N
http://linked.open.../vavai/riv/strany	59-64
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Pavelka, Jan Grmela, Lubomír Koktavý, Pavel Dobis, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	655729
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/02:PU30661
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	spectral density, noise spectroscopy, agening, reliability (en)
http://linked.open.../riv/klicoveSlovo	spectral density noise spectroscopy reliability agening
http://linked.open...ontrolniKodProRIV	[E3FDB8F7AB83]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Noise and Non-linearity Testing of Modern Electronic Components - NNT
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...UplatneniVysledku	2002
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Koktavý, Pavel Pavelka, Jan Dobis, Pavel
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2001-09-12 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Ing. Zdeněk Novotný CSc.
https://schema.org/isbn	80-238-9094-8
http://localhost/t...ganizacniJednotka	26220

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