About: Microplasma Noise in Semiconductor GaAsP diodes

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hass been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability density w(t0) of the impulse separation t0 and the probability density w(t1) of the impulse width t1 have exponential courses. The power spectral density of the noise current is of a G-R process type and depends on the particular microplasma properties. From the viewpoint of noise diagnostics, the most important features are the s Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hass been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability density w(t0) of the impulse separation t0 and the probability density w(t1) of the impulse width t1 have exponential courses. The power spectral density of the noise current is of a G-R process type and depends on the particular microplasma properties. From the viewpoint of noise diagnostics, the most important features are the s (en) v určitých režimech provozu elektronických součástek obsahujících závěrně polarizovaný PN přechod může docházet ke vzniku dvou nebo vícehladinových náhodných proudových impulzů. (cs)
Title	Microplasma Noise in Semiconductor GaAsP diodes Microplasma Noise in Semiconductor GaAsP diodes (en) Šum mikroplazmy v polovodičových GaAsP diodách (cs)
skos:prefLabel	Microplasma Noise in Semiconductor GaAsP diodes Microplasma Noise in Semiconductor GaAsP diodes (en) Šum mikroplazmy v polovodičových GaAsP diodách (cs)
skos:notation	RIV/00216305:26220/02:PU30655!RIV06-GA0-26220___
http://linked.open.../vavai/riv/strany	85-89
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA103/01/1058), Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Koktavý, Pavel Šikula, Josef Koktavý, Bohumil
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	615416
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/02:PU30655
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Noise, Microplasma, Reliability, LED diode, Avalanche Breakdown (en)
http://linked.open.../riv/klicoveSlovo	LED diode Noise Reliability Microplasma Avalanche Breakdown
http://linked.open...ontrolniKodProRIV	[676AE93EB3DB]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Noise and Non-linearity Testing of Modern Electronic Components
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Electromagnetic and acoustic emission in solids
http://linked.open...UplatneniVysledku	2002
http://linked.open...iv/tvurceVysledku	Koktavý, Pavel Šikula, Josef Koktavý, Bohumil
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2001-09-12 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Ing. Zdeněk Novotný CSc.
https://schema.org/isbn	80-238-9094-8
http://localhost/t...ganizacniJednotka	26220

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