About: Local measurement of optically induced photocurrent in semiconductor structures

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Photocurrent (PC) spectroscopic techniques have demonstrated to be helpful experimental method to investigate the local properties of bulk semiconductors, microstructures, surfaces and interfaces. We have measured locally induced PC of semiconductor quantum structures using a technique of reflection Scanning Near-field Optical Microscope (r-SNOM) in combination with Ti:Sapphire laser and tuning dye laser and with He-Ne laser. The r-SNOM employs an uncoated and/or Au-metalized single-mode fiber tip both in illumination and collection mode. Taking opportunity of the high lateral resolution of the microscope and combining it with fast micro-PL, it is possible to locate e.g. defects in a multiple quantum well grown by molecular beam epitaxy. Near-field characteristics of measured quantities are also discussed. Photocurrent (PC) spectroscopic techniques have demonstrated to be helpful experimental method to investigate the local properties of bulk semiconductors, microstructures, surfaces and interfaces. We have measured locally induced PC of semiconductor quantum structures using a technique of reflection Scanning Near-field Optical Microscope (r-SNOM) in combination with Ti:Sapphire laser and tuning dye laser and with He-Ne laser. The r-SNOM employs an uncoated and/or Au-metalized single-mode fiber tip both in illumination and collection mode. Taking opportunity of the high lateral resolution of the microscope and combining it with fast micro-PL, it is possible to locate e.g. defects in a multiple quantum well grown by molecular beam epitaxy. Near-field characteristics of measured quantities are also discussed. (en)
Title	Local measurement of optically induced photocurrent in semiconductor structures Local measurement of optically induced photocurrent in semiconductor structures (en)
skos:prefLabel	Local measurement of optically induced photocurrent in semiconductor structures Local measurement of optically induced photocurrent in semiconductor structures (en)
skos:notation	RIV/00216305:26220/02:PU29105!RIV/2003/MSM/262203/N
http://linked.open.../vavai/riv/strany	630-634
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(LA 031), P(OC 523.40), Z(MSM 262200022)
http://linked.open...iv/cisloPeriodika	4096
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Uhdeová, Naděžda Dobisová, Markéta Tománek, Pavel Dobis, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	651986
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/02:PU29105
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	locally induced photocurrent, scanning near-field optical microscopy, super-resolution, AlGaAs/GaAs, Fabry-Perot effect (en)
http://linked.open.../riv/klicoveSlovo	super-resolution AlGaAs/GaAs Fabry-Perot effect scanning near-field optical microscopy locally induced photocurrent
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[10A93AFF3E14]
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	http://linked.opendata.cz/resource/domain/vavai/projekt/LA%20031 http://linked.opendata.cz/resource/domain/vavai/projekt/OC%20523.40
http://linked.open...UplatneniVysledku	2002
http://linked.open...v/svazekPeriodika	4096
http://linked.open...iv/tvurceVysledku	Tománek, Pavel Dobis, Pavel Uhdeová, Naděžda Dobisová, Markéta
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200022
issn	0277-786X
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

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