About: PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Random two-level or multiple-level current impulses may occur in electronic devices containing re-verse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, fea-turing constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hhas been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability den-sity w(0) of the impulse separation 0 and the probability density w(1) of the impulse width 1 have exponential courses. The power spectral density of the noise current is of a G-R process type and de-pends on the particular microplasma properties. From the viewpoint of noise diagnostics, the m Random two-level or multiple-level current impulses may occur in electronic devices containing re-verse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, fea-turing constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hhas been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability den-sity w(0) of the impulse separation 0 and the probability density w(1) of the impulse width 1 have exponential courses. The power spectral density of the noise current is of a G-R process type and de-pends on the particular microplasma properties. From the viewpoint of noise diagnostics, the m (en)
Title	PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes (en)
skos:prefLabel	PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes PN Junction Local Avalanche Breakdown Induced Microplasma Noise In Semiconductor GaAsP Diodes (en)
skos:notation	RIV/00216305:26220/01:PU23912!RIV/2002/GA0/262202/N
http://linked.open.../vavai/riv/strany	193-196
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA102/99/1088), P(GA103/01/1058)
http://linked.open...vai/riv/dodaniDat	2002
http://linked.open...aciTvurceVysledku	Koktavý, Pavel Šikula, Josef
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	691319
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/01:PU23912
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Microplasma noise, Local avalanche breakdown, LED diodes, Reliability (en)
http://linked.open.../riv/klicoveSlovo	Reliability LED diodes Local avalanche breakdown Microplasma noise
http://linked.open...ontrolniKodProRIV	[DCCB96386765]
http://linked.open...v/mistoKonaniAkce	Gainesville Florida USA
http://linked.open...i/riv/mistoVydani	Gainesville, Florida, USA
http://linked.open...i/riv/nazevZdroje	Proceedings of ICNF 2001
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Noise spectroscopy and diagnostics of insulating systems with high temperature-proof materials Electromagnetic and acoustic emission in solids
http://linked.open...UplatneniVysledku	2001
http://linked.open...iv/tvurceVysledku	Koktavý, Pavel Šikula, Josef
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2001-10-22 (xsd:date)
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	University of Florida, Gainesville, Florida, USA
https://schema.org/isbn	981-02-4677-3
http://localhost/t...ganizacniJednotka	26220

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 77 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software