About: Near-field photoluminescence as high resolution diagnostics of semiconductor structures

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About: Near-field photoluminescence as high resolution diagnostics of semiconductor structures Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Scanning Near-field Optical Microscope, in which an uncoated single-mode fiber tip is used both as nanosource to excite the semiconductor sample and as nanoprobe to investigate characteristics of the structure and to pick up the photoluminescence (PL) reflected from the sample, is applied for the diagnostics of the defects in semiconductor devices. Using the high lateral resolution of the microscope with fast micro-photoluminiscence response, it is possible to locate non-luminescence defects in a multipple quantum well grown by molecular beam epitaxy. Near-field characteristics of measured spectral PL intensity are also discussed. Scanning Near-field Optical Microscope, in which an uncoated single-mode fiber tip is used both as nanosource to excite the semiconductor sample and as nanoprobe to investigate characteristics of the structure and to pick up the photoluminescence (PL) reflected from the sample, is applied for the diagnostics of the defects in semiconductor devices. Using the high lateral resolution of the microscope with fast micro-photoluminiscence response, it is possible to locate non-luminescence defects in a multipple quantum well grown by molecular beam epitaxy. Near-field characteristics of measured spectral PL intensity are also discussed. (en)
Title	Near-field photoluminescence as high resolution diagnostics of semiconductor structures Near-field photoluminescence as high resolution diagnostics of semiconductor structures (en)
skos:prefLabel	Near-field photoluminescence as high resolution diagnostics of semiconductor structures Near-field photoluminescence as high resolution diagnostics of semiconductor structures (en)
skos:notation	RIV/00216305:26220/01:PU23630!RIV/2002/MSM/262202/N
http://linked.open.../vavai/riv/strany	439-443
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(OC 523.40)
http://linked.open...vai/riv/dodaniDat	2002
http://linked.open...aciTvurceVysledku	Otevřelová, Dana Tománek, Pavel Brüstlová, Jitka Dobis, Pavel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	688402
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/01:PU23630
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Scanning near-field optical microscope, photoluminescence, quantum well structure, spectral photoluminescence intensity, subwavelength resolution (en)
http://linked.open.../riv/klicoveSlovo	subwavelength resolution Scanning near-field optical microscope photoluminescence quantum well structure spectral photoluminescence intensity
http://linked.open...ontrolniKodProRIV	[495EED2B67C9]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of Materials structure and micromechanics of fracture
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	http://linked.opendata.cz/resource/domain/vavai/projekt/OC%20523.40
http://linked.open...UplatneniVysledku	2001
http://linked.open...iv/tvurceVysledku	Tománek, Pavel Dobis, Pavel Brüstlová, Jitka Košťálová, Dana
http://linked.open...vavai/riv/typAkce	CST - Celostátní
http://linked.open.../riv/zahajeniAkce	2001-06-27 (xsd:date)
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	VUTIUM
https://schema.org/isbn	80-24-14-1892-3
http://localhost/t...ganizacniJednotka	26220

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