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  • In this paper a comparative study of different wet-chemical etching procedures of vicinal Si(1 1 1) surface passivation is presented. The stability against oxidation under ambient atmosphere was studied by X-ray photoelectron spectroscopy and atomic force microscopy. The best results were achieved by the buffered HF etching and the final smoothing of the surface by hot (72 C) NH4F. The procedures consisting of a large number of etching steps were unsatisfactory, since the probability of contamination during each step was increasing. The passivated surface was stable against oxidation for at least 3 h under ambient atmosphere.
  • In this paper a comparative study of different wet-chemical etching procedures of vicinal Si(1 1 1) surface passivation is presented. The stability against oxidation under ambient atmosphere was studied by X-ray photoelectron spectroscopy and atomic force microscopy. The best results were achieved by the buffered HF etching and the final smoothing of the surface by hot (72 C) NH4F. The procedures consisting of a large number of etching steps were unsatisfactory, since the probability of contamination during each step was increasing. The passivated surface was stable against oxidation for at least 3 h under ambient atmosphere. (en)
Title
  • Stability of hydrogen-terminated silicon surface under ambient atmosphere
  • Stability of hydrogen-terminated silicon surface under ambient atmosphere (en)
skos:prefLabel
  • Stability of hydrogen-terminated silicon surface under ambient atmosphere
  • Stability of hydrogen-terminated silicon surface under ambient atmosphere (en)
skos:notation
  • RIV/00216305:26210/10:PU85842!RIV10-MSM-26210___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GEFON/06/E001), P(KAN400100701), P(LC06040), Z(MSM0021630508)
http://linked.open...iv/cisloPeriodika
  • 11
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 289580
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26210/10:PU85842
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Silicon substrates, Wet-chemical pre-treatment, Etching, Oxidation, X-ray photoelectron spectroscopy (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [C2EFB1238B80]
http://linked.open...i/riv/nazevZdroje
  • Applied Surface Science
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 256
http://linked.open...iv/tvurceVysledku
  • Kolíbal, Miroslav
  • Mach, Jindřich
  • Šikola, Tomáš
  • Čechal, Jan
  • Bartošík, Miroslav
http://linked.open...n/vavai/riv/zamer
issn
  • 0169-4332
number of pages
http://localhost/t...ganizacniJednotka
  • 26210
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