About: How to make full use of surface structure characteristics for evaluation of high precise technologies, when the quality of products is required in the range smaller than one micrometer.

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About: How to make full use of surface structure characteristics for evaluation of high precise technologies, when the quality of products is required in the range smaller than one micrometer. Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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Description	Many thasks in engineering research and development are now linked with the surfaces rather than the bulk of material. From the viewpoint of nanotechnology requirements it is timely to review the state of the art in surface metrology and to use all the possibilities of structure analysis and utilize not only the classical characteristics, but also the characteristics nonconventional. Many thasks in engineering research and development are now linked with the surfaces rather than the bulk of material. From the viewpoint of nanotechnology requirements it is timely to review the state of the art in surface metrology and to use all the possibilities of structure analysis and utilize not only the classical characteristics, but also the characteristics nonconventional. (en)
Title	How to make full use of surface structure characteristics for evaluation of high precise technologies, when the quality of products is required in the range smaller than one micrometer. How to make full use of surface structure characteristics for evaluation of high precise technologies, when the quality of products is required in the range smaller than one micrometer. (en)
skos:prefLabel	How to make full use of surface structure characteristics for evaluation of high precise technologies, when the quality of products is required in the range smaller than one micrometer. How to make full use of surface structure characteristics for evaluation of high precise technologies, when the quality of products is required in the range smaller than one micrometer. (en)
skos:notation	RIV/00216305:26210/03:PU48088!RIV/2004/GA0/262104/N
http://linked.open.../vavai/riv/strany	166-171
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA101/02/0770)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Bumbálek, Leoš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta strojního inženýrství
http://linked.open...dnocenehoVysledku	609371
http://linked.open...ai/riv/idVysledku	RIV/00216305:26210/03:PU48088
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	nanotechnology, surface parameters (en)
http://linked.open.../riv/klicoveSlovo	surface parameters nanotechnology
http://linked.open...ontrolniKodProRIV	[4B32243B28E0]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	International Conference NANO´03
http://linked.open...in/vavai/riv/obor	JR
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http://linked.open...vavai/riv/projekt	Evaluation of the material deformation behaviour during machining and the possibility of its use for determination of dynamic material properties
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Bumbálek, Leoš
http://linked.open...vavai/riv/typAkce	CST - Celostátní
http://linked.open.../riv/zahajeniAkce	2003-10-21 (xsd:date)
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	ČSNMT Praha
https://schema.org/isbn	80-214-2527-X
http://localhost/t...ganizacniJednotka	26210

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