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About:
Low-frequency Noise Measurements used for semiconductors light active devices
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An Entity of Type :
http://linked.opendata.cz/ontology/domain/vavai/Vysledek
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linked.opendata.cz
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http://linked.opendata.cz/ontology/domain/vavai/Vysledek
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rdf:type
skos:Concept
http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description
Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.
Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.
(en)
Článek v angličtině.
(cs)
Title
Low-frequency Noise Measurements used for semiconductors light active devices
Článek v angličtině.
(cs)
Low-frequency Noise Measurements used for semiconductors light active devices
(en)
skos:prefLabel
Low-frequency Noise Measurements used for semiconductors light active devices
Článek v angličtině.
(cs)
Low-frequency Noise Measurements used for semiconductors light active devices
(en)
skos:notation
RIV/00216305:26110/05:PU56285!RIV06-GA0-26110___
http://linked.open.../vavai/riv/strany
86-93
http://linked.open...avai/riv/aktivita
P
http://linked.open...avai/riv/aktivity
P(GA102/04/0142)
http://linked.open...vai/riv/dodaniDat
2006
http://linked.open...aciTvurceVysledku
Chobola, Zdeněk
Vaněk, Jiří
http://linked.open.../riv/druhVysledku
D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju
S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele
Vysoké učení technické v Brně / Fakulta stavební
http://linked.open...dnocenehoVysledku
528481
http://linked.open...ai/riv/idVysledku
RIV/00216305:26110/05:PU56285
http://linked.open...riv/jazykVysledku
eng - angličtina
http://linked.open.../riv/klicovaSlova
Low frequency noise, diagnostic, Silicon, Solar Cells
(en)
http://linked.open.../riv/klicoveSlovo
Silicon
diagnostic
Solar Cells
Low frequency noise
http://linked.open...ontrolniKodProRIV
[8F6815C27441]
http://linked.open...v/mistoKonaniAkce
Praha
http://linked.open...i/riv/mistoVydani
Austin, Texas
http://linked.open...i/riv/nazevZdroje
Noise in Devices
http://linked.open...in/vavai/riv/obor
BM
http://linked.open...ichTvurcuVysledku
2
(
xsd:int
)
http://linked.open...cetTvurcuVysledku
2
(
xsd:int
)
http://linked.open...vavai/riv/projekt
Noise spectroscopy for fast non-destructive testing of solar cells quality, reliability and service lifetime
http://linked.open...UplatneniVysledku
2005
http://linked.open...iv/tvurceVysledku
Chobola, Zdeněk
Vaněk, Jiří
http://linked.open...vavai/riv/typAkce
EUR - Evropská
http://linked.open.../riv/zahajeniAkce
1999-09-05
(
xsd:date
)
number of pages
8
(
xsd:int
)
http://purl.org/ne...btex#hasPublisher
Neuveden
https://schema.org/isbn
0-8194-5839-2
http://localhost/t...ganizacniJednotka
26110
is
http://linked.open...avai/riv/vysledek
of
Low-frequency Noise Measurements used for semiconductors light active devices
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