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  • The article deals with the preparation and execution of the drop test of the electron microscope assembly. Based on the finite element method (FEM), the simplified numerical model of the assembly is created for this purpose. The aim of the nonlinear dynamic analysis has been to obtain the size and direction of maximum inertia forces in the system during the simulated impact of the model on basis. Calculated values are verified by actual drop tests of the assembly. Theoretical results are re-adjusted according to the test results. The conditions of the drop tests are governed by the internal regulations of the manufacturer. Based on the knowledge of the actual load, the load carrying structural parts of the assembly (supporting frame, horizontal frame) may be properly designed. Sufficient strength and rigidity must be guaranteed especially with regard to the transportation where rough treatment can be expected.
  • The article deals with the preparation and execution of the drop test of the electron microscope assembly. Based on the finite element method (FEM), the simplified numerical model of the assembly is created for this purpose. The aim of the nonlinear dynamic analysis has been to obtain the size and direction of maximum inertia forces in the system during the simulated impact of the model on basis. Calculated values are verified by actual drop tests of the assembly. Theoretical results are re-adjusted according to the test results. The conditions of the drop tests are governed by the internal regulations of the manufacturer. Based on the knowledge of the actual load, the load carrying structural parts of the assembly (supporting frame, horizontal frame) may be properly designed. Sufficient strength and rigidity must be guaranteed especially with regard to the transportation where rough treatment can be expected. (en)
Title
  • Detail Theoretical Preparation of the Drop Test of an Electron Microscope.
  • Detail Theoretical Preparation of the Drop Test of an Electron Microscope. (en)
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  • Detail Theoretical Preparation of the Drop Test of an Electron Microscope.
  • Detail Theoretical Preparation of the Drop Test of an Electron Microscope. (en)
skos:notation
  • RIV/00216275:25510/11:39892706!RIV12-MSM-25510___
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  • 193664
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  • RIV/00216275:25510/11:39892706
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  • Inertial forces; Horizontal frame; Supporting frame; Dummy body; Electron microscope; Drop test (en)
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  • [C746809CF881]
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  • Praha
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  • Berlin
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  • Vibration Problems ICOVP 2011
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  • Kanický, Viktor
  • Paščenko, Petr
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issn
  • 0930-8989
number of pages
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  • Springer-Verlag
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  • 978-94-007-2068-8
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  • 25510
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