About: Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations

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About: Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://www.sciencedirect.com/science/article/pii/S0022309313001300
Description	The use of high resolution X-ray photoelectron spectroscopy to study chalcogenide glass thin films is analyzed. It is shown that the method is an effective tool to explore different chemical environments in the films and control chemical composition of the surface. Examples of the method applications such as kinetics study of induced silver dissolution in the thin films and investigation of oxidation on the surface of the thin film are presented. Limitations of the method are shown on the example of photoinduced structural transformations in chalcogenide glass thin films. The use of high resolution X-ray photoelectron spectroscopy to study chalcogenide glass thin films is analyzed. It is shown that the method is an effective tool to explore different chemical environments in the films and control chemical composition of the surface. Examples of the method applications such as kinetics study of induced silver dissolution in the thin films and investigation of oxidation on the surface of the thin film are presented. Limitations of the method are shown on the example of photoinduced structural transformations in chalcogenide glass thin films. (en)
Title	Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations (en)
skos:prefLabel	Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations (en)
skos:notation	RIV/00216275:25310/13:39896251!RIV14-GA0-25310___
http://linked.open...avai/predkladatel	Fakulta chemicko-technologická
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GAP204/11/0832)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Vlček, Miroslav
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Pardubice / Fakulta chemicko-technologická
http://linked.open...dnocenehoVysledku	72415
http://linked.open...ai/riv/idVysledku	RIV/00216275:25310/13:39896251
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	thin films; X-ray photoelectron spectroscopy; chalcogenide glass (en)
http://linked.open.../riv/klicoveSlovo	X-ray photoelectron spectroscopy chalcogenide glass thin films
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[22200377852C]
http://linked.open...i/riv/nazevZdroje	Journal of Non-Crystalline Solids
http://linked.open...in/vavai/riv/obor	CA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Fabrication of optical elements based on micro- and nanostructuring of chalcogenide layers
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	377
http://linked.open...iv/tvurceVysledku	Vlček, Miroslav Golovchak, Roman Jain, Himanshu Kovalskiy, Andriy
http://linked.open...ain/vavai/riv/wos	000325304800034
issn	0022-3093
number of pages	4 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.jnoncrysol.2013.02.030
http://localhost/t...ganizacniJednotka	25310

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