About: Preparation of dielectric mirrors from high-refractive index contrast amorphous chalcogenide films     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • We report the preparation of planar 15-layer dielectric mirrors by a thermal evaporation of alternating high refractive index contrast amorphous chalcogenide Sb?Se and Ge?S layers, exhibiting a highreflection band around 1.55 um. The layer deposition quality and the thickness accuracy of such prepared chalcogenide multilayers were then checked using transmission electron microscopy. The layer thickness deviation of chalcogenide layers did not exceed 7 nm in comparison with the desired thicknesses. The width of Sb?Se/Ge?S layer boundary was approximately 3 nm, which is in good agreement with the surface roughness values of thermally evaporated Sb?Se and Ge?S single layers. The optical properties of the prepared 15-layer dielectric mirrors were consistent in temperature range of 20?120 °C; however, at higher temperatures there started apparent structural changes of Sb?Se films, which were followed by their crystallization. Excellent optical properties of chalcogenide materials in the infrared range mak
  • We report the preparation of planar 15-layer dielectric mirrors by a thermal evaporation of alternating high refractive index contrast amorphous chalcogenide Sb?Se and Ge?S layers, exhibiting a highreflection band around 1.55 um. The layer deposition quality and the thickness accuracy of such prepared chalcogenide multilayers were then checked using transmission electron microscopy. The layer thickness deviation of chalcogenide layers did not exceed 7 nm in comparison with the desired thicknesses. The width of Sb?Se/Ge?S layer boundary was approximately 3 nm, which is in good agreement with the surface roughness values of thermally evaporated Sb?Se and Ge?S single layers. The optical properties of the prepared 15-layer dielectric mirrors were consistent in temperature range of 20?120 °C; however, at higher temperatures there started apparent structural changes of Sb?Se films, which were followed by their crystallization. Excellent optical properties of chalcogenide materials in the infrared range mak (en)
  • Práce se zaměřuje na studium vlastností dielektrických zrcadel pro infračervenou oblast 1.55 um zhotovených z tenkých vrstev amorfních chalkogenidů systému Sb-Se a Ge-S. (cs)
Title
  • Preparation of dielectric mirrors from high-refractive index contrast amorphous chalcogenide films
  • Příprava dielektrických zrcadel z tenkých vrstev amorfních chalkogenidů s vysokým kontrastem indexů lomu (cs)
  • Preparation of dielectric mirrors from high-refractive index contrast amorphous chalcogenide films (en)
skos:prefLabel
  • Preparation of dielectric mirrors from high-refractive index contrast amorphous chalcogenide films
  • Příprava dielektrických zrcadel z tenkých vrstev amorfních chalkogenidů s vysokým kontrastem indexů lomu (cs)
  • Preparation of dielectric mirrors from high-refractive index contrast amorphous chalcogenide films (en)
skos:notation
  • RIV/00216275:25310/08:00007548!RIV09-GA0-25310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GP203/08/P204), P(LC523), Z(MSM0021627501)
http://linked.open...iv/cisloPeriodika
  • N
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 389021
http://linked.open...ai/riv/idVysledku
  • RIV/00216275:25310/08:00007548
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Chalcogenides; Thin films; Electron microscopy; Optical properties (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [2B3B767D7EFE]
http://linked.open...i/riv/nazevZdroje
  • Journal of Physics and Chemistry of Solids
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 69
http://linked.open...iv/tvurceVysledku
  • Frumar, Miloslav
  • Kohoutek, Tomáš
  • Orava, Jiří
  • Wágner, Tomáš
  • Hrdlička, Martin
  • Vlček, Milan
http://linked.open...n/vavai/riv/zamer
issn
  • 0022-3697
number of pages
http://localhost/t...ganizacniJednotka
  • 25310
is http://linked.open...avai/riv/vysledek of
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software