About: Determination of the surface roughness and refractive index of amorphous As40S60 films deposited by spin coating     Goto   Sponge   NotDistinct   Permalink

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  • An envelope method, based on the optical reflection spectrum taken at normal incidence, has been successfully applied to thegeometrical-optical characterization of thin dielectric films having significant surface roughness. Such a method allows the determination of the average thickness and the refractive index of the films with accuracies better than 1%, as well as the average amplitude of the surface roughness with an accuracy of about 2%. Amorphous As40S60 thin films have been deposited by spin coating, onto glass substrates, from a solution of the bulk material in n-propylamine. Indications of the surface roughness in these films were found from total (specular plus diffuse) reflectance measurements using an integrating sphere, and also from mechanical measurements using a stylus profiler. The latter technique provided a value for the average surface roughness of 20 +/- 4 nm, which is in excellent agreement w
  • An envelope method, based on the optical reflection spectrum taken at normal incidence, has been successfully applied to thegeometrical-optical characterization of thin dielectric films having significant surface roughness. Such a method allows the determination of the average thickness and the refractive index of the films with accuracies better than 1%, as well as the average amplitude of the surface roughness with an accuracy of about 2%. Amorphous As40S60 thin films have been deposited by spin coating, onto glass substrates, from a solution of the bulk material in n-propylamine. Indications of the surface roughness in these films were found from total (specular plus diffuse) reflectance measurements using an integrating sphere, and also from mechanical measurements using a stylus profiler. The latter technique provided a value for the average surface roughness of 20 +/- 4 nm, which is in excellent agreement w (en)
  • Byla studována drsnost povrchu a index lomu amorfních filmů As40S60 připravených metodou %22spin coating%22 (cs)
Title
  • Určení drsnosti povrchu a indexu lomu amorfních filmů As40S60 připravených metodou %22spin coating%22 (cs)
  • Determination of the surface roughness and refractive index of amorphous As40S60 films deposited by spin coating
  • Determination of the surface roughness and refractive index of amorphous As40S60 films deposited by spin coating (en)
skos:prefLabel
  • Určení drsnosti povrchu a indexu lomu amorfních filmů As40S60 připravených metodou %22spin coating%22 (cs)
  • Determination of the surface roughness and refractive index of amorphous As40S60 films deposited by spin coating
  • Determination of the surface roughness and refractive index of amorphous As40S60 films deposited by spin coating (en)
skos:notation
  • RIV/00216275:25310/04:00001377!RIV/2005/MSM/253105/N
http://linked.open.../vavai/riv/strany
  • 147-154
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM 253100001)
http://linked.open...iv/cisloPeriodika
  • 27
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 560133
http://linked.open...ai/riv/idVysledku
  • RIV/00216275:25310/04:00001377
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • refraction index;surface roughness;amorphous films; (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [B02C0EDE80E8]
http://linked.open...i/riv/nazevZdroje
  • Optical Materials
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • Neuveden
http://linked.open...iv/tvurceVysledku
  • Vlček, Miroslav
  • Prieto-Alcon, R.
  • Elliott, S. R.
  • Márquez, E.
  • González-Leal, J. M.
  • Stuchlík, Marek
http://linked.open...n/vavai/riv/zamer
issn
  • 0925-3467
number of pages
http://localhost/t...ganizacniJednotka
  • 25310
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