About: Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications

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About: Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541
Description	Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Ge crystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals. Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Ge crystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals. (en)
Title	Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications (en)
skos:prefLabel	Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications (en)
skos:notation	RIV/00216224:14740/14:00079915!RIV15-MSM-14740___
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(ED1.1.00/02.0068), S
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Mikulík, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Středoevropský technologický institut
http://linked.open...dnocenehoVysledku	45020
http://linked.open...ai/riv/idVysledku	RIV/00216224:14740/14:00079915
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Crystals; Monochromators; Simulations; Surface quality testing; X-ray imaging; X-rays; Germanium; Single point diamond turning; Polishing; Reflectivity (en)
http://linked.open.../riv/klicoveSlovo	X-ray imaging Monochromators Reflectivity Single point diamond turning Surface quality testing Crystals Simulations Germanium X-rays Polishing
http://linked.open...ontrolniKodProRIV	[EF06A11C6D3F]
http://linked.open...v/mistoKonaniAkce	San Diego
http://linked.open...i/riv/mistoVydani	USA
http://linked.open...i/riv/nazevZdroje	Advances in X-Ray/EUV Optics and Components IX
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	10 (xsd:int)
http://linked.open...vavai/riv/projekt	Central european institute of technology
http://linked.open...UplatneniVysledku	2014
http://linked.open...iv/tvurceVysledku	Ferrari, C. Korytár, D. Mikulík, Petr Vagovič, P. Dobročka, E. Jergel, M. Zápražný, Z. Šiffalovič, P. Demydenko, M. Mikloška, M.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000343877600030
http://linked.open.../riv/zahajeniAkce	2014-10-08 (xsd:date)
issn	0277-786X
number of pages	14 (xsd:int)
http://bibframe.org/vocab/doi	10.1117/12.2061353
http://purl.org/ne...btex#hasPublisher	SPIE-INT SOC OPTICAL ENGINEERING
https://schema.org/isbn	9781628412345
http://localhost/t...ganizacniJednotka	14740

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