About: Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy

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About: Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://journals.iucr.org/j/issues/2014/06/00/rg5074/rg5074.pdf
Description	The structure and composition of Bi2Te3-delta topological insulator layers grown by molecular beam epitaxy is studied as a function of beam flux composition. It is demonstrated that, depending on the Te/Bi2Te3 flux ratio, different layer compositions are obtained corresponding to a Te deficit delta varying between 0 and 1. On the basis of X-ray diffraction analysis and a theoretical description using a random stacking model, it is shown that for delta >= 0 the structure of the epilayers is described well by a random stacking of Te-Bi-Te-Bi-Te quintuple layers and Bi-Bi bilayers sharing the same basic hexagonal lattice structure. The random stacking model accounts for the observed surface step structure of the layers and compares very well with the measured X-ray data, from which the lattice parameters a and c as a function of the chemical composition were deduced. The structure and composition of Bi2Te3-delta topological insulator layers grown by molecular beam epitaxy is studied as a function of beam flux composition. It is demonstrated that, depending on the Te/Bi2Te3 flux ratio, different layer compositions are obtained corresponding to a Te deficit delta varying between 0 and 1. On the basis of X-ray diffraction analysis and a theoretical description using a random stacking model, it is shown that for delta >= 0 the structure of the epilayers is described well by a random stacking of Te-Bi-Te-Bi-Te quintuple layers and Bi-Bi bilayers sharing the same basic hexagonal lattice structure. The random stacking model accounts for the observed surface step structure of the layers and compares very well with the measured X-ray data, from which the lattice parameters a and c as a function of the chemical composition were deduced. (en)
Title	Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy (en)
skos:prefLabel	Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy (en)
skos:notation	RIV/00216224:14740/14:00079372!RIV15-MSM-14740___
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GA14-08124S)
http://linked.open...iv/cisloPeriodika	December
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Caha, Ondřej
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Středoevropský technologický institut
http://linked.open...dnocenehoVysledku	47895
http://linked.open...ai/riv/idVysledku	RIV/00216224:14740/14:00079372
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	X-RAY-DIFFRACTION; SINGLE DIRAC CONE; SURFACE-STATES; BI2TE3 FILMS; THIN-FILMS; PHASES; SYSTEM; BITE; SI (en)
http://linked.open.../riv/klicoveSlovo	SI SYSTEM PHASES X-RAY-DIFFRACTION BITE THIN-FILMS BI2TE3 FILMS SINGLE DIRAC CONE SURFACE-STATES
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[BF70F91E527B]
http://linked.open...i/riv/nazevZdroje	Journal of Applied Crystallography
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Rtg difraktometrie s vysokým rozlišením náhodných vrstevnatých systémů
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	47
http://linked.open...iv/tvurceVysledku	Caha, Ondřej Holý, Václav Springholz, Günter Steiner, Hubert Bauer, Guenther Volobuev, Valentine
http://linked.open...ain/vavai/riv/wos	000345877900010
issn	0021-8898
number of pages	12 (xsd:int)
http://bibframe.org/vocab/doi	10.1107/S1600576714020445
http://localhost/t...ganizacniJednotka	14740

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