About: Independent analysis of mechanical data from atomic force microscopy

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Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://stacks.iop.org/0957-0233/25/i=4/a=044009
Description	Present atomic force microscopes are capable of acquiring large data volumes by point using point force-distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force-distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy. Present atomic force microscopes are capable of acquiring large data volumes by point using point force-distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force-distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy. (en)
Title	Independent analysis of mechanical data from atomic force microscopy Independent analysis of mechanical data from atomic force microscopy (en)
skos:prefLabel	Independent analysis of mechanical data from atomic force microscopy Independent analysis of mechanical data from atomic force microscopy (en)
skos:notation	RIV/00216224:14740/14:00073269!RIV15-MSM-14740___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED1.1.00/02.0068), P(TA02010784)
http://linked.open...iv/cisloPeriodika	4
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Nečas, David
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Středoevropský technologický institut
http://linked.open...dnocenehoVysledku	21166
http://linked.open...ai/riv/idVysledku	RIV/00216224:14740/14:00073269
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	atomic force microscopy; mechanical properties; volume data (en)
http://linked.open.../riv/klicoveSlovo	mechanical properties volume data atomic force microscopy
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[ECAAB16BBD2B]
http://linked.open...i/riv/nazevZdroje	Measurement Science and Technology
http://linked.open...in/vavai/riv/obor	JB
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Central european institute of technology Optimization of thin film systems used in the optics industry
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	25
http://linked.open...iv/tvurceVysledku	Klapetek, Petr Nečas, David
http://linked.open...ain/vavai/riv/wos	000332932800010
issn	0957-0233
number of pages	8 (xsd:int)
http://bibframe.org/vocab/doi	10.1088/0957-0233/25/4/044009
http://localhost/t...ganizacniJednotka	14740

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