About: Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The films under study were deposited by e-beam evaporation on yttria-stabilized zirconia crystalline samples on the n-doped Si (111) substrate at 750 C. The electrical conductivity and the activation energy as the function of the yttria content indicated the influence of isolated oxygen ion vacancies as well as the associated point defects.The measured microhardness data as well as a high refractive index render from YSZ a promising material for protective coatings and optical applications respectively. The films under study were deposited by e-beam evaporation on yttria-stabilized zirconia crystalline samples on the n-doped Si (111) substrate at 750 C. The electrical conductivity and the activation energy as the function of the yttria content indicated the influence of isolated oxygen ion vacancies as well as the associated point defects.The measured microhardness data as well as a high refractive index render from YSZ a promising material for protective coatings and optical applications respectively. (en) Merene vrstvicky byly deponovany pomoci e-beam vyparovani na yttriem stabilizovanych zirkoniovych vzorcich na n-dopovanem Si (111) pri teplote 750 C. Mereni elektricke vodivosti a aktivacni energie v zavislosti na koncentraci yttria ukazuje na pritomnost izolovanych kyslikovych iontovych vakanci a s tim spojenych bodovych poruch. Vyledky mereni mechanickych resp. optickych vlastnosti (mikrotvrdost),resp. index lomu ukazuji na vhodnost vyuziti vrstvicek pro ochranné ucely. (cs)
Title	Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets (en) Vliv strukturních nedokonalostí na charakteristiky YSZ dielektrických vrstev (cs)
skos:prefLabel	Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets (en) Vliv strukturních nedokonalostí na charakteristiky YSZ dielektrických vrstev (cs)
skos:notation	RIV/00216224:14410/05:00013806!RIV06-MSM-14410___
http://linked.open.../vavai/riv/strany	247-259
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM 143100003)
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Navrátil, Vladislav Navrátil, Karel
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Pedagogická fakulta
http://linked.open...dnocenehoVysledku	519451
http://linked.open...ai/riv/idVysledku	RIV/00216224:14410/05:00013806
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Yttria stabilized zirconia; thin films; electrical conductivity; microhardness; refractive index; relative permitivity (en)
http://linked.open.../riv/klicoveSlovo	relative permitivity Yttria stabilized zirconia electrical conductivity microhardness refractive index thin films
http://linked.open...ontrolniKodProRIV	[0EEDE56DAB44]
http://linked.open...v/mistoKonaniAkce	Smolenice, Slovakia
http://linked.open...i/riv/mistoVydani	Bratislava
http://linked.open...i/riv/nazevZdroje	Acta Physica Slovaca
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	9 (xsd:int)
http://linked.open...UplatneniVysledku	2005
http://linked.open...iv/tvurceVysledku	Kundracik, František Navrátil, Vladislav Navrátil, Karel Zemek, Jan Chromik, Stefan Gandarilla, F. C. Gmucová, Katarina Hartmannová, Mária Jergel, Martin
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2004-01-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20143100003
issn	0323-0465
number of pages	13 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Fyzikálny ústav SAV
http://localhost/t...ganizacniJednotka	14410
is http://linked.open...avai/riv/vysledek of	Effect of Structural Imperfections on the Characteristics of YSZ Dielectric Layers Grown by E-beam Evaporation fron the Crystalline Taggets

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