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  • Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local refinement in order to minimize the amount of information that would be useless in the data processing phase. The data obtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in the data processing phase instead of during the measurement. In this article, we also discuss the influence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.
  • Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local refinement in order to minimize the amount of information that would be useless in the data processing phase. The data obtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in the data processing phase instead of during the measurement. In this article, we also discuss the influence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach. (en)
Title
  • Non-equidistant scanning approach for millimetre-sized SPM measurements
  • Non-equidistant scanning approach for millimetre-sized SPM measurements (en)
skos:prefLabel
  • Non-equidistant scanning approach for millimetre-sized SPM measurements
  • Non-equidistant scanning approach for millimetre-sized SPM measurements (en)
skos:notation
  • RIV/00216224:14330/12:00080254!RIV15-MSM-14330___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(FR-TI1/241)
http://linked.open...iv/cisloPeriodika
  • 213
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 154373
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14330/12:00080254
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • SPM (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [6B7DBCA8CBAF]
http://linked.open...i/riv/nazevZdroje
  • Nanoscale Research Letters
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 7
http://linked.open...iv/tvurceVysledku
  • Klapetek, Petr
  • Buršík, Petr
  • Valtr, Mirosla
http://linked.open...ain/vavai/riv/wos
  • 000304306600001
issn
  • 1931-7573
number of pages
http://bibframe.org/vocab/doi
  • 10.1186/1556-276X-7-213
http://localhost/t...ganizacniJednotka
  • 14330
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