About: High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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Title	High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots (en)
skos:prefLabel	High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots (en)
skos:notation	RIV/00216224:14310/97:00000544!RIV/2002/MSM/143102/N
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http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
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http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
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http://linked.open.../riv/klicovaSlova	High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots (en)
http://linked.open.../riv/klicoveSlovo	High resolution X-ray diffraction and reflectivity studies f vertical and lateral ordering in multiple self-organized InGaAs quantum dots
http://linked.open...odStatuVydavatele	JP - Japonsko
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http://linked.open...i/riv/nazevZdroje	Jpn.J.Appl.Phys.
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http://linked.open...UplatneniVysledku	1997
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http://linked.open...iv/tvurceVysledku	Holý, Václav Darhuber, A. A.
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