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Description
  • The study of polycrystalline CeO2 + xSm2O3 (x = 0, 10.9–15.9 mol %) thin films deposited by Electron Beam Physical Vapour Deposition (EBPVD) and Ionic Beam Assisted Deposition (IBAD) techniques on the Si substrate was devoted to the influence of deposition conditions used, namely composition x, deposition temperature Tdep and Ar+ ion bombardment, on the (micro)hardness, Hpl and elastic modulus,Y with respect to the film structure and microstructure. These mechanical characteristics were investigated by the instrumented indentation technique as the functions of relative indentation depth hrel = hmax/t and the values obtained were compared with those obtained by the classical Vickers technique. Results of this study are described and discussed.
  • The study of polycrystalline CeO2 + xSm2O3 (x = 0, 10.9–15.9 mol %) thin films deposited by Electron Beam Physical Vapour Deposition (EBPVD) and Ionic Beam Assisted Deposition (IBAD) techniques on the Si substrate was devoted to the influence of deposition conditions used, namely composition x, deposition temperature Tdep and Ar+ ion bombardment, on the (micro)hardness, Hpl and elastic modulus,Y with respect to the film structure and microstructure. These mechanical characteristics were investigated by the instrumented indentation technique as the functions of relative indentation depth hrel = hmax/t and the values obtained were compared with those obtained by the classical Vickers technique. Results of this study are described and discussed. (en)
Title
  • Influence of deposition conditions on electrical and mechanical properties of Sm2O3 doped CeO2 thin films prepared by EB-PVD (+IBAD) methods part 2. Indentation hardness and effective elastic modulus
  • Influence of deposition conditions on electrical and mechanical properties of Sm2O3 doped CeO2 thin films prepared by EB-PVD (+IBAD) methods part 2. Indentation hardness and effective elastic modulus (en)
skos:prefLabel
  • Influence of deposition conditions on electrical and mechanical properties of Sm2O3 doped CeO2 thin films prepared by EB-PVD (+IBAD) methods part 2. Indentation hardness and effective elastic modulus
  • Influence of deposition conditions on electrical and mechanical properties of Sm2O3 doped CeO2 thin films prepared by EB-PVD (+IBAD) methods part 2. Indentation hardness and effective elastic modulus (en)
skos:notation
  • RIV/00216224:14310/13:00070881!RIV14-MSM-14310___
http://linked.open...avai/predkladatel
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I
http://linked.open...iv/cisloPeriodika
  • 7
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 79724
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/13:00070881
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • mechanical properties; hardness; elastic modulus; nanoindentation; thin films; CeO2; Sm2O3; doping (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • RU - Ruská federace
http://linked.open...ontrolniKodProRIV
  • [8C9051B5F45D]
http://linked.open...i/riv/nazevZdroje
  • Russian Journal of Electrochemistry
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 49
http://linked.open...iv/tvurceVysledku
  • Buršíková, Vilma
  • Mansilla, C.
  • Navrátil, Vladislav
  • Hartmanová, Marie
http://linked.open...ain/vavai/riv/wos
  • 000321773800003
issn
  • 1023-1935
number of pages
http://bibframe.org/vocab/doi
  • 10.1134/S1023193513070033
http://localhost/t...ganizacniJednotka
  • 14310
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