About: Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Electrical conductivity, dielectric permittivity and mechanical hardness of the polycrystalline CeO2 + xSm2O3 (x = 0, 10.9-15.9 mol %) films prepared by Electron Beam Physical Vapour Deposition (EB-PVD) and Ionic Beam Assisted Deposition, (IBAD), techniques were investigated in dependence on their structure and microstructure influenced by the deposition conditions, namely composition, deposition temperature and Ar+ ion bombardment. The electrical conductivity of doped ceria prepared without Ar+ ion bombardment and investigated by the impedance spectroscopy, IS, was found to be predominantly ionic one under the oxidizing atmosphere/low-temperature conditions and the higher amounts of Sm2O3 (>10 mol %) used. The bulk conductivity as a part of total measured conductivity was a subject of interest because the grain boundary conductivity was found to be 3 orders of magnitude lower than the corresponding bulk conductivity. Electrical conductivity, dielectric permittivity and mechanical hardness of the polycrystalline CeO2 + xSm2O3 (x = 0, 10.9-15.9 mol %) films prepared by Electron Beam Physical Vapour Deposition (EB-PVD) and Ionic Beam Assisted Deposition, (IBAD), techniques were investigated in dependence on their structure and microstructure influenced by the deposition conditions, namely composition, deposition temperature and Ar+ ion bombardment. The electrical conductivity of doped ceria prepared without Ar+ ion bombardment and investigated by the impedance spectroscopy, IS, was found to be predominantly ionic one under the oxidizing atmosphere/low-temperature conditions and the higher amounts of Sm2O3 (>10 mol %) used. The bulk conductivity as a part of total measured conductivity was a subject of interest because the grain boundary conductivity was found to be 3 orders of magnitude lower than the corresponding bulk conductivity. (en)
Title	Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films (en)
skos:prefLabel	Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films (en)
skos:notation	RIV/00216224:14310/11:00049535!RIV12-AV0-14310___
http://linked.open...avai/predkladatel	Přírodovědecká fakulta
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(KAN311610701), S, Z(MSM0021622411)
http://linked.open...iv/cisloPeriodika	5
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Navrátil, Vladislav Buršíková, Vilma
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	196219
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/11:00049535
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	CeO2; Sm2O3; e-beam evaporation; ionic beam assisted deposition; impedance spectroscopy; indentation technique; electrical conductivity; dielectric permittivity; microhardness (en)
http://linked.open.../riv/klicoveSlovo	impedance spectroscopy electrical conductivity microhardness CeO2 Sm2O3 dielectric permittivity e-beam evaporation indentation technique ionic beam assisted deposition
http://linked.open...odStatuVydavatele	CZ - Česká republika
http://linked.open...ontrolniKodProRIV	[9AD593368C32]
http://linked.open...i/riv/nazevZdroje	Russian Journal of Electrochemistry
http://linked.open...in/vavai/riv/obor	BL
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Nanometrology using methods of scanning probe microscopy
http://linked.open...UplatneniVysledku	2011
http://linked.open...v/svazekPeriodika	47
http://linked.open...iv/tvurceVysledku	Buršíková, Vilma Hartmanová, Maria Kundracik, František Mansilla, C. Navrátil, Vladislav
http://linked.open...n/vavai/riv/zamer	Study and application of plasma chemical reactions in non-isothermic low temperature plasma and its interaction with solid surface
issn	1023-1935
number of pages	12 (xsd:int)
http://localhost/t...ganizacniJednotka	14310
is http://linked.open...avai/riv/vysledek of	Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 35 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software