About: Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Densities of Mn ions in epitaxial layers of (Ga,Mn)As were determined by anomalous x-ray diffraction, i.e., by a measurement of the dependence of the intensity of weak diffraction 002 on the photon energy around the MnK absorption edge. From the measured data it was possible to determine the density of Mn ions in substitutional positions and the difference in the Mn densities in two possible interstitial positions in the GaAs lattice. The data confirm the previous finding that the density of Mn interstitials in centers of Ga tetrahedrons decrease during post-growth annealing. Densities of Mn ions in epitaxial layers of (Ga,Mn)As were determined by anomalous x-ray diffraction, i.e., by a measurement of the dependence of the intensity of weak diffraction 002 on the photon energy around the MnK absorption edge. From the measured data it was possible to determine the density of Mn ions in substitutional positions and the difference in the Mn densities in two possible interstitial positions in the GaAs lattice. The data confirm the previous finding that the density of Mn interstitials in centers of Ga tetrahedrons decrease during post-growth annealing. (en)
Title	Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction (en)
skos:prefLabel	Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction (en)
skos:notation	RIV/00216224:14310/10:00049717!RIV12-GA0-14310___
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(7E08093), P(GP202/09/P410), P(IAA101120805), S, Z(AV0Z10100521), Z(MSM0021620834), Z(MSM0021622410)
http://linked.open...iv/cisloPeriodika	18
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Caha, Ondřej
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	253310
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/10:00049717
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	ferromagnetic semiconductos; anomal x-ray diffraction (en)
http://linked.open.../riv/klicoveSlovo	anomal x-ray diffraction ferromagnetic semiconductos
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[F3C3927AB6A9]
http://linked.open...i/riv/nazevZdroje	Applied Physics Letters
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Nanostructured Magnetic Materials for Nano-spintronics Strain engineering in diluted magnetic semiconductors Coherent x-ray scattering from individual defect in the crystal lattice
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	97
http://linked.open...iv/tvurceVysledku	Martí, Xavier Novák, Vít Caha, Ondřej Cukr, Miroslav Holý, Václav Horák, Lukáš Schülli, Tobias Urs
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films Condensed Matter Physics – New Materials and Technologies Physical and chemical properties of advanced materials and structures
issn	0003-6951
number of pages	3 (xsd:int)
http://bibframe.org/vocab/doi	10.1063/1.3514240
http://localhost/t...ganizacniJednotka	14310
is http://linked.open...avai/riv/vysledek of	Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction

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