About: X-ray scattering study of oxide precipitates in Cz-Si

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry. Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry. (en)
Title	X-ray scattering study of oxide precipitates in Cz-Si X-ray scattering study of oxide precipitates in Cz-Si (en)
skos:prefLabel	X-ray scattering study of oxide precipitates in Cz-Si X-ray scattering study of oxide precipitates in Cz-Si (en)
skos:notation	RIV/00216224:14310/10:00046556!RIV11-GA0-14310___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/09/1013), P(GP202/09/P410), Z(MSM0021622410)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Caha, Ondřej Buršík, Jiří Meduňa, Mojmír Bernatová, Silvie Mikulík, Petr Růžička, Jiří
http://linked.open.../riv/druhVysledku	O - Ostatní výsledky nezařaditelné do žádného z výše uvedených druhů výsledku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	299060
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/10:00046556
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	x-ray; silicon; defects (en)
http://linked.open.../riv/klicoveSlovo	defects silicon x-ray
http://linked.open...ontrolniKodProRIV	[AD30947C186D]
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...vavai/riv/projekt	Strain engineering in diluted magnetic semiconductors Nucleation and growth of oxygen precipitates in silicon
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Buršík, Jiří Růžička, Jiří Svoboda, Milan Bernstorff, S. Caha, Ondřej Bernatová, Silvie Meduňa, Mojmír Mikulík, Petr
http://linked.open...n/vavai/riv/zamer	Physical and chemical properties of advanced materials and structures
http://localhost/t...ganizacniJednotka	14310

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