About: Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges     Goto   Sponge   NotDistinct   Permalink

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  • We have performed a comparative study of the properties of films deposited in the rf CCP discharges from a mixture of 5% of hexamethyldisiloxane in oxygen at two different pressures 2.5 and 40 Pa in continuous and pulsed modes. Changes in optical and especially mechanical properties of the films were observed due to differing pressure. Slight changes in the properties were also achieved by pulsing the discharge. Films deposited at 2.5 Pa exhibited very low compressive stress and hardness from 5.5 to 6.9 GPa. Soft films of 1.6 GPa maximum hardness possessing a tensile stress and containing more CH3-related groups were deposited at a pressure of 40 Pa. Hard SiO2-like films (11-13.5 GPa) were deposited from the same mixture in the ICP mode of a helicon reactor at the pressure of 0.3 Pa at which the CCP discharge could not be sustained. These films possessed relatively high compressive stress. Increasing off-time up to 15 ms caused a slight decrease in the hardness and in the case of 0.
  • We have performed a comparative study of the properties of films deposited in the rf CCP discharges from a mixture of 5% of hexamethyldisiloxane in oxygen at two different pressures 2.5 and 40 Pa in continuous and pulsed modes. Changes in optical and especially mechanical properties of the films were observed due to differing pressure. Slight changes in the properties were also achieved by pulsing the discharge. Films deposited at 2.5 Pa exhibited very low compressive stress and hardness from 5.5 to 6.9 GPa. Soft films of 1.6 GPa maximum hardness possessing a tensile stress and containing more CH3-related groups were deposited at a pressure of 40 Pa. Hard SiO2-like films (11-13.5 GPa) were deposited from the same mixture in the ICP mode of a helicon reactor at the pressure of 0.3 Pa at which the CCP discharge could not be sustained. These films possessed relatively high compressive stress. Increasing off-time up to 15 ms caused a slight decrease in the hardness and in the case of 0. (en)
Title
  • Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges
  • Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges (en)
skos:prefLabel
  • Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges
  • Comparative Study of Films Deposited from HMDSO/O2 in Continuous Wave and Pulsed rf Discharges (en)
skos:notation
  • RIV/00216224:14310/07:00022256!RIV10-MSM-14310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(1K05025), Z(AV0Z20410507), Z(MSM0021622411)
http://linked.open...iv/cisloPeriodika
  • S1
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 414255
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/07:00022256
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • PECVD; hexamethyldisiloxane; oxygen; CCP; ICP (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • DE - Spolková republika Německo
http://linked.open...ontrolniKodProRIV
  • [697236911E81]
http://linked.open...i/riv/nazevZdroje
  • Plasma Processes and Polymers
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 4
http://linked.open...iv/tvurceVysledku
  • Buršík, Jiří
  • Buršíková, Vilma
  • Franta, Daniel
  • Zajíčková, Lenka
  • Bousquet, Angelique
  • Goullet, Antoine
  • Granier, Agnes
http://linked.open...n/vavai/riv/zamer
issn
  • 1612-8850
number of pages
http://localhost/t...ganizacniJednotka
  • 14310
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