About: Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films

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About: Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper, the optical analysis of the As–S thin films prepared under different conditions is performed using three dispersion models for amorphous materials typically employed in practice. The Tauc–Lorentz (TL) model, Urbach–Cody–Lorentz (UCL) model and our model based on the parameterization of the density of electronic states (PDOS model) are namely used to determine the optical parameters of these films. Within the structural model of the As–S films, the existence of the optical constants profiles and overlayers on to the upper boundaries of these films are included. Dispersion and structural models are employed within the analysis based on a combination of variable angle spectroscopic ellipsometry and transmission spectrophotometry in conjunction with multi-sample modification. It is demonstrated that the TL model is not suitable for the optical characterization of the As–S thin films because of the absence of the Urbach tail. In this paper, the optical analysis of the As–S thin films prepared under different conditions is performed using three dispersion models for amorphous materials typically employed in practice. The Tauc–Lorentz (TL) model, Urbach–Cody–Lorentz (UCL) model and our model based on the parameterization of the density of electronic states (PDOS model) are namely used to determine the optical parameters of these films. Within the structural model of the As–S films, the existence of the optical constants profiles and overlayers on to the upper boundaries of these films are included. Dispersion and structural models are employed within the analysis based on a combination of variable angle spectroscopic ellipsometry and transmission spectrophotometry in conjunction with multi-sample modification. It is demonstrated that the TL model is not suitable for the optical characterization of the As–S thin films because of the absence of the Urbach tail. (en)
Title	Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films (en)
skos:prefLabel	Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films (en)
skos:notation	RIV/00216224:14310/06:00016388!RIV10-MO0-14310___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA203/05/0524), Z(AV0Z20650511), Z(MO0FVT0000404)
http://linked.open...iv/cisloPeriodika	52-54
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Omasta, Jaroslav Ohlídal, Ivan Franta, Daniel Šiler, Martin
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	469254
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/06:00016388
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	ellipsometry; chalcogenides (en)
http://linked.open.../riv/klicoveSlovo	ellipsometry chalcogenides
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[E2598E37EC92]
http://linked.open...i/riv/nazevZdroje	Journal of Non-Crystalline Solids
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Photonics glasses and amorphous films
http://linked.open...UplatneniVysledku	2006
http://linked.open...v/svazekPeriodika	352
http://linked.open...iv/tvurceVysledku	Franta, Daniel Frumar, Miloslav Ohlídal, Ivan Šiler, Martin Vižďa, František Jedelský, Jaroslav Omasta, Jaroslav
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies Research and development of modern materials and technologies for the applications to the military equipment
issn	0022-3093
number of pages	8 (xsd:int)
http://localhost/t...ganizacniJednotka	14310
is http://linked.open...avai/riv/vysledek of	Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films

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