About: Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces     Goto   Sponge   NotDistinct   Permalink

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  • In this chapter several fractal and multi-fractal analysis methods are studied to characterize their efficiency on evaluating fractal properties of randomly rough surfaces. Moreover, results concerning estimation of atomic force microscopy (AFM) tip influence on evaluation of fractal properties of rough surfaces are presented. Randomly rough surfaces are simulated by means of spectral synthesis method and AFM tip convolution with the simulated surface is numerically performed. The results of the fractal and multi-fractal analysis before and after tip convolution are compared. It is shown that significant discrepancies can be observed between different fractal analysis methods applied on the same simulated data. This fact is true in particular if the data are convolved with AFM tip having relatively large apex radius in comparison to objects forming surface roughness
  • In this chapter several fractal and multi-fractal analysis methods are studied to characterize their efficiency on evaluating fractal properties of randomly rough surfaces. Moreover, results concerning estimation of atomic force microscopy (AFM) tip influence on evaluation of fractal properties of rough surfaces are presented. Randomly rough surfaces are simulated by means of spectral synthesis method and AFM tip convolution with the simulated surface is numerically performed. The results of the fractal and multi-fractal analysis before and after tip convolution are compared. It is shown that significant discrepancies can be observed between different fractal analysis methods applied on the same simulated data. This fact is true in particular if the data are convolved with AFM tip having relatively large apex radius in comparison to objects forming surface roughness (en)
Title
  • Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces
  • Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces (en)
skos:prefLabel
  • Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces
  • Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces (en)
skos:notation
  • RIV/00216224:14310/05:00015082!RIV10-MSM-14310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021622411)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 513287
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/05:00015082
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • AFM (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [B698083824FE]
http://linked.open...v/mistoKonaniAkce
  • Weinheim 2005
http://linked.open...i/riv/mistoVydani
  • Weinheim 2005
http://linked.open...i/riv/nazevZdroje
  • Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Klapetek, Petr
  • Ohlídal, Ivan
  • Bílek, Jindřich
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Wiley-VCH Verlag GmbH and Co. KGaA
https://schema.org/isbn
  • 3-527-40502-X
http://localhost/t...ganizacniJednotka
  • 14310
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