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Description
  • We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper.
  • We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper. (en)
  • We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper. (cs)
Title
  • Difrakční efekty v infračervené elipsometrii vodivých vzorků (cs)
  • Diffraction effects in infrared ellipsometry of conducting samples
  • Diffraction effects in infrared ellipsometry of conducting samples (en)
skos:prefLabel
  • Difrakční efekty v infračervené elipsometrii vodivých vzorků (cs)
  • Diffraction effects in infrared ellipsometry of conducting samples
  • Diffraction effects in infrared ellipsometry of conducting samples (en)
skos:notation
  • RIV/00216224:14310/04:00021209!RIV08-MSM-14310___
http://linked.open.../vavai/riv/strany
  • 177-182
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM 143100002)
http://linked.open...iv/cisloPeriodika
  • 1
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 560592
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/04:00021209
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Infrared ellipsometry; Diffraction; Metals (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [FE72D217E4DA]
http://linked.open...i/riv/nazevZdroje
  • Thin Solid Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 455-456
http://linked.open...iv/tvurceVysledku
  • Humlíček, Josef
  • Bernhardt, Christian
http://linked.open...n/vavai/riv/zamer
issn
  • 0040-6090
number of pages
http://localhost/t...ganizacniJednotka
  • 14310
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