About: The effect of the substrate on thermal stability of CeOx and Rh-Ce-O thin films     Goto   Sponge   NotDistinct   Permalink

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  • Cerium oxide doped by a noble metal has been researched intensively for its high catalytic activity. In the presented study, Rh-Ce-O and CeOx thin films were deposited onto SiO2 and Cu substrates by radio-frequency magnetron sputtering. Thermal stability of the films was investigated by photoelectron spectroscopy techniques. Our results show that the substrate has a great influence on the stability of the overlayers. Rh-Ce-O deposited on Cu decomposes into rhodium and cerium oxide separate phases above 600 K. In contrary, the Rh-Ce-O film on SiO2 remains stable up to 800 K, but silicon migrates from the substrate into the film, forming cerium silicate. We suggest that a strong interaction between SiO2 substrate and Rh-Ce-O, or CeOx films, could be responsible for higher thermal stability compared to films deposited onto Cu.
  • Cerium oxide doped by a noble metal has been researched intensively for its high catalytic activity. In the presented study, Rh-Ce-O and CeOx thin films were deposited onto SiO2 and Cu substrates by radio-frequency magnetron sputtering. Thermal stability of the films was investigated by photoelectron spectroscopy techniques. Our results show that the substrate has a great influence on the stability of the overlayers. Rh-Ce-O deposited on Cu decomposes into rhodium and cerium oxide separate phases above 600 K. In contrary, the Rh-Ce-O film on SiO2 remains stable up to 800 K, but silicon migrates from the substrate into the film, forming cerium silicate. We suggest that a strong interaction between SiO2 substrate and Rh-Ce-O, or CeOx films, could be responsible for higher thermal stability compared to films deposited onto Cu. (en)
Title
  • The effect of the substrate on thermal stability of CeOx and Rh-Ce-O thin films
  • The effect of the substrate on thermal stability of CeOx and Rh-Ce-O thin films (en)
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  • The effect of the substrate on thermal stability of CeOx and Rh-Ce-O thin films
  • The effect of the substrate on thermal stability of CeOx and Rh-Ce-O thin films (en)
skos:notation
  • RIV/00216208:11320/14:10289725!RIV15-MSM-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(LD13054), P(LG12003), S
http://linked.open...iv/cisloPeriodika
  • 10-11
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 13566
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  • RIV/00216208:11320/14:10289725
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  • cerium silicate; thin film; mixed oxide; rhodium; ceria; photoelectron spectroscopy (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [2E63FC8CAE76]
http://linked.open...i/riv/nazevZdroje
  • Surface and Interface Analysis
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http://linked.open...v/svazekPeriodika
  • 46
http://linked.open...iv/tvurceVysledku
  • Matolín, Vladimír
  • Tsud, Nataliya
  • Vorokhta, Mykhailo
  • Nehasil, Václav
  • Kobayashi, Keisuke
  • Kobata, Masaaki
  • Ševčíková, Klára
  • Yoshikawa, Hideki
  • Zahoranová, Tatiana
http://linked.open...ain/vavai/riv/wos
  • 000344987400068
issn
  • 0142-2421
number of pages
http://bibframe.org/vocab/doi
  • 10.1002/sia.5503
http://localhost/t...ganizacniJednotka
  • 11320
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