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  • AlN/Fe/AlN/Cu nanostructures with ultrathin Fe grown by sputtering on Si substrates are evaluated as probes for magnetooptical (MO) mapping of weak currents. They are considered for a laser wavelength of lambda = 410 nm (3.02 eV) and operate at oblique light incidence angles, phi((0)), to enable detection of both in-plane and out-of-plane magnetization. Their performance is evaluated in terms of MO reflected wave electric field amplitudes. The maximal MO amplitudes in AlN/Fe/AlN/Cu are achieved by a proper choice of layer thicknesses. The nanostructures were characterized by MO polar Kerr effect at phi((0)) approximate to 5 degrees and longitudinal Kerr effect spectra (phi((0)) = 45 degrees) at photon energies between 1 and 5 eV. The nominal profiles were refined using a model-based analysis of the spectra. Closed form analytical expressions are provided, which are useful in the search for maximal MO amplitudes. (C) 2014 AIP Publishing LLC.
  • AlN/Fe/AlN/Cu nanostructures with ultrathin Fe grown by sputtering on Si substrates are evaluated as probes for magnetooptical (MO) mapping of weak currents. They are considered for a laser wavelength of lambda = 410 nm (3.02 eV) and operate at oblique light incidence angles, phi((0)), to enable detection of both in-plane and out-of-plane magnetization. Their performance is evaluated in terms of MO reflected wave electric field amplitudes. The maximal MO amplitudes in AlN/Fe/AlN/Cu are achieved by a proper choice of layer thicknesses. The nanostructures were characterized by MO polar Kerr effect at phi((0)) approximate to 5 degrees and longitudinal Kerr effect spectra (phi((0)) = 45 degrees) at photon energies between 1 and 5 eV. The nominal profiles were refined using a model-based analysis of the spectra. Closed form analytical expressions are provided, which are useful in the search for maximal MO amplitudes. (C) 2014 AIP Publishing LLC. (en)
Title
  • AlN/Fe/AlN nanostructures for magnetooptic magnetometry
  • AlN/Fe/AlN nanostructures for magnetooptic magnetometry (en)
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  • AlN/Fe/AlN nanostructures for magnetooptic magnetometry
  • AlN/Fe/AlN nanostructures for magnetooptic magnetometry (en)
skos:notation
  • RIV/00216208:11320/14:10288854!RIV15-MSM-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(GAP205/11/2137)
http://linked.open...iv/cisloPeriodika
  • 17
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
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http://linked.open...dnocenehoVysledku
  • 2220
http://linked.open...ai/riv/idVysledku
  • RIV/00216208:11320/14:10288854
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • constants; fe; metals; films; optical-properties (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [32EFE805BE00]
http://linked.open...i/riv/nazevZdroje
  • Journal of Applied Physics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 115
http://linked.open...iv/tvurceVysledku
  • Jakubisová, Eva
  • Višňovský, Štefan
  • Celinski, Z.
  • Harward, I.
  • Hrabovsky, D.
  • Pistora, J.
  • Siroky, P.
http://linked.open...ain/vavai/riv/wos
  • 000335643700181
issn
  • 0021-8979
number of pages
http://bibframe.org/vocab/doi
  • 10.1063/1.4868490
http://localhost/t...ganizacniJednotka
  • 11320
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