About: Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://dx.doi.org/10.1016/j.tsf.2014.06.029
Description	Vapor phase deposition of poly(ethylene) is shown to produce uncross-linked thin films consisting of linear CH2 (100) oligomers with narrow molar mass distribution of dispersity D-M - 1.10. Early stages of the film formation are characterized by the growth of two-dimensional compact islands of constant 7-8 nm thickness. The transversal evolution of islands is studied in the context of the Dynamic Scaling Theory. The aggregation regime is found to be valid in a narrow range of coverage 0.1 < theta < 0.3. The critical island size is estimated to be i = 1. Kinetic roughening of the growing front gives a set of the scaling exponents alpha(loc) = 0.67, alpha(s) = 0.85, beta = 0.33 (beta = 0.2 for the late stages of growth) and z = 2.2 that does not fit into any of the known universality classes. Macromolecular relaxation at the island edges is suggested to explain the observed inconsistence. Vapor phase deposition of poly(ethylene) is shown to produce uncross-linked thin films consisting of linear CH2 (100) oligomers with narrow molar mass distribution of dispersity D-M - 1.10. Early stages of the film formation are characterized by the growth of two-dimensional compact islands of constant 7-8 nm thickness. The transversal evolution of islands is studied in the context of the Dynamic Scaling Theory. The aggregation regime is found to be valid in a narrow range of coverage 0.1 < theta < 0.3. The critical island size is estimated to be i = 1. Kinetic roughening of the growing front gives a set of the scaling exponents alpha(loc) = 0.67, alpha(s) = 0.85, beta = 0.33 (beta = 0.2 for the late stages of growth) and z = 2.2 that does not fit into any of the known universality classes. Macromolecular relaxation at the island edges is suggested to explain the observed inconsistence. (en)
Title	Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition (en)
skos:prefLabel	Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition (en)
skos:notation	RIV/00216208:11320/14:10282220!RIV15-MSM-11320___
http://linked.open...avai/riv/aktivita	I S
http://linked.open...avai/riv/aktivity	I, S
http://linked.open...iv/cisloPeriodika	August
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Gordeev, Ivan Slavínská, Danka Shukurov, Andrey Kousal, Jaroslav Biederman, Hynek Kylián, Ondřej Solař, Pavel Hanuš, Jan Hanyková, Lenka Melnichuk, Iurii
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Karlova v Praze / Matematicko-fyzikální fakulta
http://linked.open...dnocenehoVysledku	12678
http://linked.open...ai/riv/idVysledku	RIV/00216208:11320/14:10282220
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Kinetic roughening; Dynamic scaling; Nanostructure; Island growth; Physical vapor deposition; poly(ethylene) (en)
http://linked.open.../riv/klicoveSlovo	Dynamic scaling Island growth Kinetic roughening Physical vapor deposition poly(ethylene) Nanostructure
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[3F1F3BD7EC16]
http://linked.open...i/riv/nazevZdroje	Thin Solid Films
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	10 (xsd:int)
http://linked.open...cetTvurcuVysledku	11 (xsd:int)
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	565
http://linked.open...iv/tvurceVysledku	Hanuš, Jan Kylián, Ondřej Biederman, Hynek Gordeev, Ivan Kousal, Jaroslav Shukurov, Andrey Slavínská, Danka Solař, Pavel Brus, Jiří Hanyková, Lenka Melnichuk, Iurii
http://linked.open...ain/vavai/riv/wos	000341054600038
issn	0040-6090
number of pages	12 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.tsf.2014.06.029
http://localhost/t...ganizacniJednotka	11320

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 35 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software