About: Depth profiling of ultra-thin alumina layers grown on Co(0001)

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://dx.doi.org/10.1088/0953-8984/25/9/095004
Description	Epitaxial thin oxide layers were grown by simultaneous aluminum deposition and oxidation on a Co(0001) single crystal, and the metal-oxide interface between the substrate and the grown layer was studied using photoelectron spectroscopy. The oxide layers were composed of two kinds of chemically different layers. Angle-resolved measurements were used to determine the compositions of oxide sub-layers and to reveal their respective thicknesses. The topmost oxide layers were up to 0.23 nm thick, determined by analysis of O 1s and Co 2p(3/2) photoelectron spectra. The results of the analysis show that the interface layer is composed of a mixture of oxygen and cobalt atoms and its thickness is approximately 0.6 nm. The analysis of Co 2p(3/2), Al 2p(3/2) and O 1s core level binding energies confirmed the presence of CoO in the interface layer and Al2O3 in the topmost oxide layer. Epitaxial thin oxide layers were grown by simultaneous aluminum deposition and oxidation on a Co(0001) single crystal, and the metal-oxide interface between the substrate and the grown layer was studied using photoelectron spectroscopy. The oxide layers were composed of two kinds of chemically different layers. Angle-resolved measurements were used to determine the compositions of oxide sub-layers and to reveal their respective thicknesses. The topmost oxide layers were up to 0.23 nm thick, determined by analysis of O 1s and Co 2p(3/2) photoelectron spectra. The results of the analysis show that the interface layer is composed of a mixture of oxygen and cobalt atoms and its thickness is approximately 0.6 nm. The analysis of Co 2p(3/2), Al 2p(3/2) and O 1s core level binding energies confirmed the presence of CoO in the interface layer and Al2O3 in the topmost oxide layer. (en)
Title	Depth profiling of ultra-thin alumina layers grown on Co(0001) Depth profiling of ultra-thin alumina layers grown on Co(0001) (en)
skos:prefLabel	Depth profiling of ultra-thin alumina layers grown on Co(0001) Depth profiling of ultra-thin alumina layers grown on Co(0001) (en)
skos:notation	RIV/00216208:11320/13:10192057!RIV14-MSM-11320___
http://linked.open...avai/predkladatel	Matematicko-fyzikální fakulta
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(LD11047), P(LG12003)
http://linked.open...iv/cisloPeriodika	9
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Matolín, Vladimír Skála, Tomáš
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Karlova v Praze / Matematicko-fyzikální fakulta
http://linked.open...dnocenehoVysledku	68429
http://linked.open...ai/riv/idVysledku	RIV/00216208:11320/13:10192057
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	film growth and epitaxy; Methods of deposition of films and coatings; Oxidation; Composition and phase identification (en)
http://linked.open.../riv/klicoveSlovo	Composition and phase identification Methods of deposition of films and coatings film growth and epitaxy Oxidation
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[BE4B0AAEFE59]
http://linked.open...i/riv/nazevZdroje	Journal of Physics Condensed Matter
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Materials science beamline at synchrotron Elettra in Trieste Model Systems of Nanostructured Bimetallic Materials for Enviromental Applications
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	25
http://linked.open...iv/tvurceVysledku	Matolín, Vladimír Prince, K. C. Skála, Tomáš Yoshitake, M. Nemsak, S.
http://linked.open...ain/vavai/riv/wos	000314823600013
issn	0953-8984
number of pages	8 (xsd:int)
http://bibframe.org/vocab/doi	10.1088/0953-8984/25/9/095004
http://localhost/t...ganizacniJednotka	11320

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