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Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
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Description
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Výzkum struktury samouspořádaných polovodičových kvantových teček pomocí trojrozměrného mapování v reciprokém prostoru
(cs)
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
(en)
Title
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Výzkum struktury samouspořádaných polovodičových kvantových teček pomocí trojrozměrného mapování v reciprokém prostoru
(cs)
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
(en)
skos:prefLabel
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Výzkum struktury samouspořádaných polovodičových kvantových teček pomocí trojrozměrného mapování v reciprokém prostoru
(cs)
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
(en)
skos:notation
RIV/00216208:11320/08:00100935!RIV09-MSM-11320___
http://linked.open...avai/riv/aktivita
Z
http://linked.open...avai/riv/aktivity
Z(MSM0021620834)
http://linked.open...iv/cisloPeriodika
22
http://linked.open...vai/riv/dodaniDat
2009
http://linked.open...aciTvurceVysledku
Holý, Václav
http://linked.open.../riv/druhVysledku
J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju
S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele
Univerzita Karlova v Praze / Matematicko-fyzikální fakulta
http://linked.open...dnocenehoVysledku
397770
http://linked.open...ai/riv/idVysledku
RIV/00216208:11320/08:00100935
http://linked.open...riv/jazykVysledku
eng - angličtina
http://linked.open.../riv/klicovaSlova
Structural; characterization; self-assembled; semiconductor; islands; three-dimensional; X-ray; diffraction; mapping; reciprocal; space
(en)
http://linked.open.../riv/klicoveSlovo
self-assembled
characterization
space
islands
semiconductor
three-dimensional
X-ray
Structural
diffraction
mapping
reciprocal
http://linked.open...odStatuVydavatele
CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV
[859C76CE359D]
http://linked.open...i/riv/nazevZdroje
Thin Solid Films
http://linked.open...in/vavai/riv/obor
BM
http://linked.open...ichTvurcuVysledku
1
(
xsd:int
)
http://linked.open...cetTvurcuVysledku
8
(
xsd:int
)
http://linked.open...UplatneniVysledku
2008
http://linked.open...v/svazekPeriodika
516
http://linked.open...iv/tvurceVysledku
Holý, Václav
Stangl, J.
Schmidbauer, M.
Metzger, T. H.
Bauer, G.
Boeck, T.
Mokuta, C.
Mundboth, K.
http://linked.open...ain/vavai/riv/wos
000260360700012
http://linked.open...n/vavai/riv/zamer
Condensed Matter Physics – New Materials and Technologies
issn
0040-6090
number of pages
7
(
xsd:int
)
http://localhost/t...ganizacniJednotka
11320
is
http://linked.open...avai/riv/vysledek
of
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
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