About: Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy     Goto   Sponge   NotDistinct   Permalink

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  • We present a design of a nanometrology measuring setup which is a part of the national standard instrumentation for nanometrology operated by the Czech Metrology Institute (CMI) in Brno, Czech Republic. The system employs a full six-axis interferometric position measurement of the sample holder consisting of six independent interferometers. Here we report on description of alignment issues and accurate adjustment of orthogonality of the measuring axes. Consequently, suppression of cosine errors and reduction of sensitivity to Abbe offset is achieved through full control in all six degrees of freedom. Due to the geometric configuration including a wide basis of the two units measuring in y-direction and the three measuring in z-direction the angle resolution of the whole setup is minimize to tens of nanoradians. Moreover, the servo-control of all six degrees of freedom allows to keep guidance errors below 100 nrad. This small range system is based on a commercial nanopositioning stage driven by piezoelectric transducers with the range (200 x 200 x 10) mu m. Thermally compensated miniature interferometric units with fiber-optic light delivery and integrated homodyne detection system were developed especially for this system and serve as sensors for othogonality alignment.
  • We present a design of a nanometrology measuring setup which is a part of the national standard instrumentation for nanometrology operated by the Czech Metrology Institute (CMI) in Brno, Czech Republic. The system employs a full six-axis interferometric position measurement of the sample holder consisting of six independent interferometers. Here we report on description of alignment issues and accurate adjustment of orthogonality of the measuring axes. Consequently, suppression of cosine errors and reduction of sensitivity to Abbe offset is achieved through full control in all six degrees of freedom. Due to the geometric configuration including a wide basis of the two units measuring in y-direction and the three measuring in z-direction the angle resolution of the whole setup is minimize to tens of nanoradians. Moreover, the servo-control of all six degrees of freedom allows to keep guidance errors below 100 nrad. This small range system is based on a commercial nanopositioning stage driven by piezoelectric transducers with the range (200 x 200 x 10) mu m. Thermally compensated miniature interferometric units with fiber-optic light delivery and integrated homodyne detection system were developed especially for this system and serve as sensors for othogonality alignment. (en)
Title
  • Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
  • Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy (en)
skos:prefLabel
  • Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy
  • Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy (en)
skos:notation
  • RIV/00177016:_____/14:#0001044!RIV15-MSM-00177016
http://linked.open...avai/riv/aktivita
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  • V
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  • 1
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  • 44750
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  • RIV/00177016:_____/14:#0001044
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  • nanometrology; nanopositioning interferometry; AFM; nanoscale (en)
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  • CH - Švýcarská konfederace
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  • [CE6D10FB930E]
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  • SENSORS
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  • 14
http://linked.open...iv/tvurceVysledku
  • Buchta, Zdeněk
  • Hrabina, Jan
  • Klapetek, Petr
  • Lazar, Josef
  • Valtr, Miroslav
  • Číp, Ondřej
  • Čížek, Martin
  • Oulehla, Jindřich
  • Šerý, Mojmír
http://linked.open...ain/vavai/riv/wos
  • 000336039100048
issn
  • 1424-8220
number of pages
http://bibframe.org/vocab/doi
  • 10.3390/s140100877
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