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  • The capability and functionality of test instrumentation enabling state-of-the-art high-frequency electrical circuit analysis has advanced dramatically during the past 5 to 10 years, but traceability to the SI has lagged behind these technical developments. These advancements have introduced new measurement quantities, and evolved existing measurement quantities, that are being used in radio frequency (RF), microwave, millimetre-wave and submillimetre-wave areas of technology. However, these quantities (e.g. mixed-mode S-parameters, X-parameters and S-parameters at millimetre- and submillimetre-wave frequencies) fall outside the scope of existing SI units and the traceability currently provided by the world’s National Measurement Institutes (NMIs). The lack of traceability for the newly developed instrumentation introduces a barrier to the use of this instrumentation in high value, high impact, fields – for example, medical, security, consumer electronics and environmental monitoring uses. The advancements in instrumentation have been required to meet the needs of existing and next-generation end-user applications, e.g. in industry and elsewhere. The challenge that this JRP addresses is to put in place traceability and dissemination mechanisms for these measurement quantities and to ensure maximum impact on the end-user community.
  • The capability and functionality of test instrumentation enabling state-of-the-art high-frequency electrical circuit analysis has advanced dramatically during the past 5 to 10 years, but traceability to the SI has lagged behind these technical developments. These advancements have introduced new measurement quantities, and evolved existing measurement quantities, that are being used in radio frequency (RF), microwave, millimetre-wave and submillimetre-wave areas of technology. However, these quantities (e.g. mixed-mode S-parameters, X-parameters and S-parameters at millimetre- and submillimetre-wave frequencies) fall outside the scope of existing SI units and the traceability currently provided by the world’s National Measurement Institutes (NMIs). The lack of traceability for the newly developed instrumentation introduces a barrier to the use of this instrumentation in high value, high impact, fields – for example, medical, security, consumer electronics and environmental monitoring uses. The advancements in instrumentation have been required to meet the needs of existing and next-generation end-user applications, e.g. in industry and elsewhere. The challenge that this JRP addresses is to put in place traceability and dissemination mechanisms for these measurement quantities and to ensure maximum impact on the end-user community. (en)
Title
  • Metrology for new electrical measurement quantities in high-frequency circuits
  • Metrology for new electrical measurement quantities in high-frequency circuits (en)
skos:notation
  • 7AX13033
http://linked.open...avai/cep/aktivita
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  • metrology; electric (en)
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  • metrology
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