About: Optical and tactile metrology for absolute form characterisation

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Projekt, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	http://linked.opendata.cz/ontology/domain/vavai/Projekt
rdfs:seeAlso	http://www.isvav.cz/projectDetail.do?rowId=7AX12104 http://www.ptb.de/emrp/ind10-home.html
Description	Flatness metrology - This JRP will considerably improve absolute flatness measurements. The results of the investigation of the ability of capacitive sensors to reach an uncertainty of 10 nm in scanning applications will be significant for common industrial use in flatness measurements. Optical imaging metrology for curved surfaces - This JRP will develop and realise a new instrument based on recently invented tilted-wave interferometry. Tactile and optical single point metrology for curved surfaces - This JRP will lead to a reduction of the current measurement uncertainty by a factor of at least 2, i.e. down to 50 nm or less. Data analysis - This JRP will develop new algorithms and software including advanced computational geometry and high-level surface fitting for 3D freeform surface reconstruction and characterisation. (en) Flatness metrology - This JRP will considerably improve absolute flatness measurements. The results of the investigation of the ability of capacitive sensors to reach an uncertainty of 10 nm in scanning applications will be significant for common industrial use in flatness measurements. Optical imaging metrology for curved surfaces - This JRP will develop and realise a new instrument based on recently invented tilted-wave interferometry. Tactile and optical single point metrology for curved surfaces - This JRP will lead to a reduction of the current measurement uncertainty by a factor of at least 2, i.e. down to 50 nm or less. Data analysis - This JRP will develop new algorithms and software including advanced computational geometry and high-level surface fitting for 3D freeform surface reconstruction and characterisation.
Title	Optical and tactile metrology for absolute form characterisation (en) Optical and tactile metrology for absolute form characterisation
skos:notation	7AX12104
http://linked.open...avai/cep/aktivita	The sixth framework programme of the European Community for research, technological development and demonstration activities
http://linked.open...kovaStatniPodpora	http://linked.opendata.cz/resource/domain/vavai/projekt/7AX12104/celkovaStatniPodpora
http://linked.open...ep/celkoveNaklady	http://linked.opendata.cz/resource/domain/vavai/projekt/7AX12104/celkoveNaklady
http://linked.open...datumDodatniDoRIV	2014-06-12 (xsd:date)
http://linked.open...i/cep/druhSouteze	RP - Spolufinancování programu ES
http://linked.open...ep/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open.../cep/fazeProjektu	100399863
http://linked.open...ai/cep/hlavniObor	JB - Senzory, čidla, měření a regulace
http://linked.open...vai/cep/kategorie	AP - Aplikovaný výzkum
http://linked.open.../cep/klicovaSlova	free form; flatness; aspheric; interferometry; scanning; tactile; optical (en)
http://linked.open...ep/partnetrHlavni	Český metrologický institut
http://linked.open...inujicichPrijemcu	0 (xsd:int)
http://linked.open...cep/pocetPrijemcu	1 (xsd:int)
http://linked.open...ocetSpoluPrijemcu	0 (xsd:int)
http://linked.open.../pocetVysledkuRIV	1 (xsd:int)
http://linked.open...enychVysledkuVRIV	1 (xsd:int)
http://linked.open...lneniVMinulemRoce	2013-03-27 (xsd:date)
http://linked.open.../prideleniPodpory	http://linked.opendata.cz/resource/domain/vavai/cep/prideleniPodpory/MSMT-2490%2F2013-310
http://linked.open...iciPoslednihoRoku	2014
http://linked.open...atUdajeProjZameru	2014
http://linked.open...usZobrazovaneFaze	DRRVK
http://linked.open...ai/cep/typPojektu	P - Projekt výzkumu a vývoje financovaný ze státního rozpočtu
http://linked.open...ep/ukonceniReseni	2014-08-31 (xsd:date)
http://linked.open...ep/zahajeniReseni	2012-01-01 (xsd:date)
http://linked.open...tniCyklusProjektu	ZBK
http://linked.open...n/vavai/cep/vyzva	http://linked.opendata.cz/resource/domain/vavai/cep/vyzva/FP6-2005-Energy-4
http://linked.open.../cep/klicoveSlovo	aspheric flatness interferometry scanning tactile free form
is http://linked.open...vavai/riv/projekt of	Optical mirror referenced capacitive flatness measurement and straightness evaluation of translation stages
is http://linked.open...vavai/cep/projekt of	http://linked.opendata.cz/resource/domain/vavai/cep/ucast/7AX12104/2012/ico%3A00177016 http://linked.opendata.cz/resource/domain/vavai/cep/ucast/7AX12104/2013/ico%3A00177016 http://linked.opendata.cz/resource/domain/vavai/cep/ucast/7AX12104/2014/ico%3A00177016

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