About: Thickness threshold of structural ordering in thin MEH-PPV films

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://www.sciencedirect.com/science/article/pii/S003238611400442X
Description	The microstructure of thin poly-[2-methoxy-5-(2´-ethyl-hexyloxy)-p- phenylene vinylene] (MEH-PPV) films was investigated by photoluminescence measurements and X-Ray diffraction analysis over thickness from several tens up to several hundreds of nanometer. Obtained results were correlated with exciton diffusion length obtained by the photovoltage method. All measurements revealed that there is a threshold thickness for the microstructural order as well as for exciton diffusion length which are primary physical properties for function of any device made up from such films. Development of more ordered phase can be observed above the critical thickness of about 150 nm. Below the threshold, the polymer chains are preferentially in conformations promoting localized intrachain interactions. Above the threshold, two main features can be observed: (i) the conjugation length of polymer chain segments reaches its maximum and (ii) polymer stacking in more ordered and larger crystalline domains influences strongly the material properties, namely enhances the exciton diffusion length. The microstructure of thin poly-[2-methoxy-5-(2´-ethyl-hexyloxy)-p- phenylene vinylene] (MEH-PPV) films was investigated by photoluminescence measurements and X-Ray diffraction analysis over thickness from several tens up to several hundreds of nanometer. Obtained results were correlated with exciton diffusion length obtained by the photovoltage method. All measurements revealed that there is a threshold thickness for the microstructural order as well as for exciton diffusion length which are primary physical properties for function of any device made up from such films. Development of more ordered phase can be observed above the critical thickness of about 150 nm. Below the threshold, the polymer chains are preferentially in conformations promoting localized intrachain interactions. Above the threshold, two main features can be observed: (i) the conjugation length of polymer chain segments reaches its maximum and (ii) polymer stacking in more ordered and larger crystalline domains influences strongly the material properties, namely enhances the exciton diffusion length. (en)
Title	Thickness threshold of structural ordering in thin MEH-PPV films Thickness threshold of structural ordering in thin MEH-PPV films (en)
skos:prefLabel	Thickness threshold of structural ordering in thin MEH-PPV films Thickness threshold of structural ordering in thin MEH-PPV films (en)
skos:notation	RIV/70883521:28610/14:43871794!RIV15-MSM-28610___
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(ED2.1.00/03.0111), P(EE.2.3.20.0104)
http://linked.open...iv/cisloPeriodika	16
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Urbánek, Pavel Kuřitka, Ivo
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Tomáše Bati ve Zlíně / Univerzitní institut
http://linked.open...dnocenehoVysledku	50428
http://linked.open...ai/riv/idVysledku	RIV/70883521:28610/14:43871794
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Threshold; Surface photovoltaic effect; Photoluminescence (en)
http://linked.open.../riv/klicoveSlovo	Threshold Photoluminescence Surface photovoltaic effect
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[6A40864D0A1D]
http://linked.open...i/riv/nazevZdroje	Polymer
http://linked.open...in/vavai/riv/obor	CD
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of Polymer Systems Advanced theoretical and experimental studies of polymer systems
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	55
http://linked.open...iv/tvurceVysledku	Daniš, Stanislav Kuřitka, Ivo Urbánek, Pavel Toušek, Jiří Toušková, Jana
http://linked.open...ain/vavai/riv/wos	000340812300087
issn	0032-3861
number of pages	7 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.polymer.2014.05.054
http://localhost/t...ganizacniJednotka	28610

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