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rdf:type
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Description
| - In the standard routines there is not used a elimination of all problem from disturbances of the way of signal from sensor to intern input of microcontroller. Regularly the primary (the first) signal form sensor has a small level of voltage. Environment of the way of signal includes some different sort of noises, it has influences of interferences. It can degrade the signal up to level without a possibility of using. During process of signal condition any technical and program means have to use. The basic technical means perform a verification range, limits effects of disturbing interference of external environment and makes filtration. Other way there are software methods where value or signal is tested according to real range or after existent model, speed of change of rising or dropping, does statistical balancing values, verification of uncertainties and errors of measurement and next operations. Significant application of those areas is used by precise and professional embedded units
- In the standard routines there is not used a elimination of all problem from disturbances of the way of signal from sensor to intern input of microcontroller. Regularly the primary (the first) signal form sensor has a small level of voltage. Environment of the way of signal includes some different sort of noises, it has influences of interferences. It can degrade the signal up to level without a possibility of using. During process of signal condition any technical and program means have to use. The basic technical means perform a verification range, limits effects of disturbing interference of external environment and makes filtration. Other way there are software methods where value or signal is tested according to real range or after existent model, speed of change of rising or dropping, does statistical balancing values, verification of uncertainties and errors of measurement and next operations. Significant application of those areas is used by precise and professional embedded units (en)
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Title
| - Aspects of input part of embedded systems
- Aspects of input part of embedded systems (en)
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skos:prefLabel
| - Aspects of input part of embedded systems
- Aspects of input part of embedded systems (en)
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skos:notation
| - RIV/70883521:28140/14:43872573!RIV15-MSM-28140___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/70883521:28140/14:43872573
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - interference disturbance, judgment of values, range limitation, signal condition, statistical balancing, uncertainty of measurement (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - GB - Spojené království Velké Británie a Severního Irska
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - International Journal of Circuits, Systems and Signal Processing
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
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issn
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number of pages
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http://localhost/t...ganizacniJednotka
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