About: X-ray radiography/tomography combined with X-ray fluorescence spectroscopy for position sensitive elemental analysis of studied objects     Goto   Sponge   NotDistinct   Permalink

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  • The goal of the work is the proposal and evaluation of new imaging methods for position sensitive elemental analysis with pixel detectors of Medipix family. These methods should extend the traditional X-ray transmission radiography and tomography, material decomposition methods and X-ray fluorescence imaging. The application of these methods covers wide range of fields of science – from material sciences through cultural heritage preservation to biology.
  • The goal of the work is the proposal and evaluation of new imaging methods for position sensitive elemental analysis with pixel detectors of Medipix family. These methods should extend the traditional X-ray transmission radiography and tomography, material decomposition methods and X-ray fluorescence imaging. The application of these methods covers wide range of fields of science – from material sciences through cultural heritage preservation to biology. (en)
Title
  • X-ray radiography/tomography combined with X-ray fluorescence spectroscopy for position sensitive elemental analysis of studied objects
  • X-ray radiography/tomography combined with X-ray fluorescence spectroscopy for position sensitive elemental analysis of studied objects (en)
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  • X-ray radiography/tomography combined with X-ray fluorescence spectroscopy for position sensitive elemental analysis of studied objects
  • X-ray radiography/tomography combined with X-ray fluorescence spectroscopy for position sensitive elemental analysis of studied objects (en)
skos:notation
  • RIV/68407700:21670/13:00217052!RIV14-MSM-21670___
http://linked.open...avai/riv/aktivita
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  • Z(MSM6840770040)
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  • 117597
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  • RIV/68407700:21670/13:00217052
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  • semiconductor detector; computed tomography; x-ray fluorescence; material decomposition (en)
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  • [03D7E219A0BC]
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  • Žemlička, Jan
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  • 21670
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