About: Non-contact imaging with enhanced spatial resolution by secondary electron detection

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Non-contact imaging with enhanced spatial resolution by secondary electron detection Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5873803
Description	The Neutron Activation Analysis is a very sensitive method for determination of element content and composition. However, conventional methods do not provide information regarding the spatial distribution of the elements in the sample. To fulfill this need, we developed an electron imaging device with electron optics which provides element spatial distribution information based on beta-gamma coincidence. The investigated element is identified by the characteristic gamma radiation while the spatial information is obtained by the position sensitive detection of β-decay electrons. Unlike common and often invasive approaches our non-destructive method provides imaging and analysis simultaneously. This system makes use of tailor-made electron optics to select and focus coincidence electrons providing higher spatial resolution and better contrast images. For this purpose the semiconductor pixel detector Timepix is used for electron detection and is triggered by a gamma detector. In this contribution we investigate the possibility to use also the secondary electrons which are emitted from the sample surface by the primary ionizing particle crossing the surface in order to achieve higher efficiency of the device. These surface produced low-energy electrons are extracted and accelerated by a high voltage static field to be consequently detected by the Timepix detector. The low initial energy of the ejected electrons causes that the secondary electrons onto the Timepix sensor are monoenergetic with energy given by high voltage field. The Neutron Activation Analysis is a very sensitive method for determination of element content and composition. However, conventional methods do not provide information regarding the spatial distribution of the elements in the sample. To fulfill this need, we developed an electron imaging device with electron optics which provides element spatial distribution information based on beta-gamma coincidence. The investigated element is identified by the characteristic gamma radiation while the spatial information is obtained by the position sensitive detection of β-decay electrons. Unlike common and often invasive approaches our non-destructive method provides imaging and analysis simultaneously. This system makes use of tailor-made electron optics to select and focus coincidence electrons providing higher spatial resolution and better contrast images. For this purpose the semiconductor pixel detector Timepix is used for electron detection and is triggered by a gamma detector. In this contribution we investigate the possibility to use also the secondary electrons which are emitted from the sample surface by the primary ionizing particle crossing the surface in order to achieve higher efficiency of the device. These surface produced low-energy electrons are extracted and accelerated by a high voltage static field to be consequently detected by the Timepix detector. The low initial energy of the ejected electrons causes that the secondary electrons onto the Timepix sensor are monoenergetic with energy given by high voltage field. (en)
Title	Non-contact imaging with enhanced spatial resolution by secondary electron detection Non-contact imaging with enhanced spatial resolution by secondary electron detection (en)
skos:prefLabel	Non-contact imaging with enhanced spatial resolution by secondary electron detection Non-contact imaging with enhanced spatial resolution by secondary electron detection (en)
skos:notation	RIV/68407700:21670/10:00225784!RIV15-MSM-21670___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(LA08015), P(LC06041), Z(MSM6840770040)
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Krejčí, František Jakůbek, Jan Kroupa, Martin
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Ústav technické a experimentální fyziky ČVUT
http://linked.open...dnocenehoVysledku	274986
http://linked.open...ai/riv/idVysledku	RIV/68407700:21670/10:00225784
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	neutron activation analysis; Timepix; pixel detectors; electron optics; beta-gamma coincidence; secondary electrons (en)
http://linked.open.../riv/klicoveSlovo	pixel detectors Timepix electron optics neutron activation analysis secondary electrons beta-gamma coincidence
http://linked.open...ontrolniKodProRIV	[AAB2902455BA]
http://linked.open...v/mistoKonaniAkce	Knoxville (Tennessee)
http://linked.open...i/riv/mistoVydani	Piscataway (New Jersey)
http://linked.open...i/riv/nazevZdroje	2010 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)
http://linked.open...in/vavai/riv/obor	BG
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Collaboration of the Czech Republic with CERN Preparation, modification and characterization of materials by energetic radiation.
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Jakůbek, Jan Krejčí, František Kroupa, Martin
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000306402900098
http://linked.open.../riv/zahajeniAkce	2010-10-30 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Application of radionuclides and ionising radiation
issn	1095-7863
number of pages	2 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/NSSMIC.2010.5873803
http://purl.org/ne...btex#hasPublisher	IEEE
https://schema.org/isbn	978-1-4244-9106-3
http://localhost/t...ganizacniJednotka	21670

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software