About: Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip     Goto   Sponge   NotDistinct   Permalink

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Description
  • 3D silicon sensors with electrodes penetrating the full substrate thickness, different electrode configurations and with active edges, where bump-bonded to the ATLAS pixel readout chip FE-I3 in 2006. Their characterization included electrical tests in laboratory, tests with beam and radioactive sources. Noise figures after bump bonding varied from 190 to 290 electrons, in agreement with the different electrode density of the three 3D configurations. This paper will reports beam results on the edge sensitivity, electrode response and efficiency at different angles of 3D sensors, fabricated at Stanford and bump-bonded to the ATLAS FE-I3 front end chip, before and after irradiation to 1015 high energy protons per cm2.
  • 3D silicon sensors with electrodes penetrating the full substrate thickness, different electrode configurations and with active edges, where bump-bonded to the ATLAS pixel readout chip FE-I3 in 2006. Their characterization included electrical tests in laboratory, tests with beam and radioactive sources. Noise figures after bump bonding varied from 190 to 290 electrons, in agreement with the different electrode density of the three 3D configurations. This paper will reports beam results on the edge sensitivity, electrode response and efficiency at different angles of 3D sensors, fabricated at Stanford and bump-bonded to the ATLAS FE-I3 front end chip, before and after irradiation to 1015 high energy protons per cm2. (en)
  • Clanek pojednava o charakterizaci hran 3D kremikoveho detektoru po Bump-Bondingu s ATLAS Pixel Readout Chipem (cs)
Title
  • Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip
  • Charakterizace hran 3D kremikoveho detektoru po Bump-Bondingu s ATLAS Pixel Readout Chipem (cs)
  • Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip (en)
skos:prefLabel
  • Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip
  • Charakterizace hran 3D kremikoveho detektoru po Bump-Bondingu s ATLAS Pixel Readout Chipem (cs)
  • Edge Characterization of 3D Silicon Sensors after Bump-Bonding with the ATLAS Pixel Readout Chip (en)
skos:notation
  • RIV/68407700:21670/08:15152671!RIV09-MSM-21670___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM6840770029)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 364871
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  • RIV/68407700:21670/08:15152671
http://linked.open...riv/jazykVysledku
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  • 3D silicon sensor; ATLAS; PIXEL (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [16381E3936BB]
http://linked.open...v/mistoKonaniAkce
  • Dresden
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  • Wisconsin
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  • Conference Record of the 2008 IEEE NSS/MIC/RTSD
http://linked.open...in/vavai/riv/obor
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http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Slavíček, Tomáš
  • Linhart, Vladimír
  • Bolle, E.
  • Chatterji, S.
  • Da Via, C.
  • Gjersdal, H.
  • Hasi, J.
  • Rohne, O.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
issn
  • 1082-3654
number of pages
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  • Omipress
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  • 978-1-4244-2715-4
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  • 21670
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