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Description
| - New developments in nanoscience and nanotechnology require nanometer scale resolution imaging tools and techniques such as an extreme ultraviolet (EUV) and soft X-ray (SXR) microscopy, based on Fresnel zone plates. In this paper, we report on applications of a desk-top microscopy using a laser-plasma EUV source based on a gas-puff target for studies of morphology of thin silicon membranes coated with NaCl crystals and samples composed of ZnO nanofibers.
- New developments in nanoscience and nanotechnology require nanometer scale resolution imaging tools and techniques such as an extreme ultraviolet (EUV) and soft X-ray (SXR) microscopy, based on Fresnel zone plates. In this paper, we report on applications of a desk-top microscopy using a laser-plasma EUV source based on a gas-puff target for studies of morphology of thin silicon membranes coated with NaCl crystals and samples composed of ZnO nanofibers. (en)
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Title
| - Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy
- Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy (en)
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skos:prefLabel
| - Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy
- Study of crystalline thin films and nanofibers by means of the laser-plasma EUV-source based microscopy (en)
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skos:notation
| - RIV/68407700:21460/13:00205809!RIV14-MSM-21460___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(EE.2.3.20.0092), P(KAN300100702), S
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21460/13:00205809
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - Nanoimaging; Extreme ultraviolet; EUV Microscopy; Fresnel zoneplates; Thin membranes; ZnO nanofibers (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Radiation Physics and Chemistry
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Brůža, Petr
- Pánek, Dalibor
- Bartnik, A.
- Fiedorowicz, H.
- Wachulak, P. W.
- Jarocki, R.
- Kostecki, J.
- Szczurek, M.
- Baranowska-Korczyc, A.
- Elbaum, D.
- Fronc, K.
- Węgrzyński, Ł.
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1016/j.radphyschem.2013.02.019
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http://localhost/t...ganizacniJednotka
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