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| rdf:type
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| rdfs:seeAlso
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| Description
| - The beam of Free-Electron Laser in Hamburg (FLASH) tuned at either 32.5 nm or 13.7 nm was focused by a grazing incidence elliptical mirror and an off-axis parabolic mirror coated by Si/Mo multilayer on 20-micron and 1-micron spot, respectively. The grazing incidence and normal incidence focusing of ~10-fs pulses carrying an energy of 10 μJ lead at the surface of various solids (Si, Al, Ti, Ta, Si3N4, BN, a-C/Si, Ni/Si, Cr/Si, Rh/Si, Ce:YAG, poly(methyl methacrylate) - PMMA, stainless steel, etc.) to an irradiance of 1013 W/cm2 and 1016 W/cm2, respectively. The optical emission of the plasmas produced under these conditions was registered by grating (1200 lines/mm and/or 150 lines/mm) spectrometer MS257 (Oriel) equipped with iCCD head (iStar 720, Andor). Surprisingly, only lines belonging to the neutral atoms were observed at intensities around 1013 W/cm2. No lines of atomic ions have been identified in UV-vis spectra emitted from the plasmas formed by the FLASH beam focused in a 20-micron spot. At intensities around 1016 W/cm2, the OE spectra are again dominated by the atomic lines. However, a weak emission of Al+ and Al2+ was registered as well. The abundance ratio of Al/Al+ should be at least 100. The plasma is really cold, an excitation temperature equivalent to 0.8 eV was found by a computer simulation of the aluminum plasma OE spectrum. A broadband emission was also registered, both from the plasmas (typical is for carbon; there were no spectral lines) and the scintillators (on Ce:YAG crystal, both the luminescence bands and the line plasma emission were recorded by the spectrometer).
- The beam of Free-Electron Laser in Hamburg (FLASH) tuned at either 32.5 nm or 13.7 nm was focused by a grazing incidence elliptical mirror and an off-axis parabolic mirror coated by Si/Mo multilayer on 20-micron and 1-micron spot, respectively. The grazing incidence and normal incidence focusing of ~10-fs pulses carrying an energy of 10 μJ lead at the surface of various solids (Si, Al, Ti, Ta, Si3N4, BN, a-C/Si, Ni/Si, Cr/Si, Rh/Si, Ce:YAG, poly(methyl methacrylate) - PMMA, stainless steel, etc.) to an irradiance of 1013 W/cm2 and 1016 W/cm2, respectively. The optical emission of the plasmas produced under these conditions was registered by grating (1200 lines/mm and/or 150 lines/mm) spectrometer MS257 (Oriel) equipped with iCCD head (iStar 720, Andor). Surprisingly, only lines belonging to the neutral atoms were observed at intensities around 1013 W/cm2. No lines of atomic ions have been identified in UV-vis spectra emitted from the plasmas formed by the FLASH beam focused in a 20-micron spot. At intensities around 1016 W/cm2, the OE spectra are again dominated by the atomic lines. However, a weak emission of Al+ and Al2+ was registered as well. The abundance ratio of Al/Al+ should be at least 100. The plasma is really cold, an excitation temperature equivalent to 0.8 eV was found by a computer simulation of the aluminum plasma OE spectrum. A broadband emission was also registered, both from the plasmas (typical is for carbon; there were no spectral lines) and the scintillators (on Ce:YAG crystal, both the luminescence bands and the line plasma emission were recorded by the spectrometer). (en)
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| Title
| - Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
- Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser (en)
|
| skos:prefLabel
| - Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser
- Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser (en)
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| skos:notation
| - RIV/68407700:21460/09:00202284!RIV13-MSM-21460___
|
| http://linked.open...avai/riv/aktivita
| |
| http://linked.open...avai/riv/aktivity
| - P(IAA400100701), P(KAN300100702), P(LA08024), P(LC510), P(LC528), V, Z(AV0Z10100523)
|
| http://linked.open...vai/riv/dodaniDat
| |
| http://linked.open...aciTvurceVysledku
| |
| http://linked.open.../riv/druhVysledku
| |
| http://linked.open...iv/duvernostUdaju
| |
| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
| |
| http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21460/09:00202284
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| http://linked.open...riv/jazykVysledku
| |
| http://linked.open.../riv/klicovaSlova
| - ree-electron laser; plasma; spectrometer (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
| |
| http://linked.open...v/mistoKonaniAkce
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| http://linked.open...i/riv/mistoVydani
| |
| http://linked.open...i/riv/nazevZdroje
| - Damage to VUV, EUV, and X-ray Optics II (Proceedings of SPIE)
|
| http://linked.open...in/vavai/riv/obor
| |
| http://linked.open...ichTvurcuVysledku
| |
| http://linked.open...cetTvurcuVysledku
| |
| http://linked.open...vavai/riv/projekt
| |
| http://linked.open...UplatneniVysledku
| |
| http://linked.open...iv/tvurceVysledku
| - Chalupský, J.
- Juha, L.
- Kuba, Jaroslav
- Rosmej, F. B.
- Cihelka, J.
- Renner, O.
|
| http://linked.open...vavai/riv/typAkce
| |
| http://linked.open...ain/vavai/riv/wos
| |
| http://linked.open.../riv/zahajeniAkce
| |
| http://linked.open...n/vavai/riv/zamer
| |
| issn
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| number of pages
| |
| http://bibframe.org/vocab/doi
| |
| http://purl.org/ne...btex#hasPublisher
| |
| https://schema.org/isbn
| |
| http://localhost/t...ganizacniJednotka
| |
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