Attributes | Values |
---|
rdf:type
| |
Description
| - Není k dispozici (cs)
- A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+-7.5) nm and ~2 mJ.cm-2, respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at um resolution by a method developed here.
- A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+-7.5) nm and ~2 mJ.cm-2, respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at um resolution by a method developed here. (en)
|
Title
| - Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids
- Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids (en)
- Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids (cs)
|
skos:prefLabel
| - Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids
- Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids (en)
- Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids (cs)
|
skos:notation
| - RIV/68407700:21460/07:12130223!RIV08-AV0-21460___
|
http://linked.open.../vavai/riv/strany
| |
http://linked.open...avai/riv/aktivita
| |
http://linked.open...avai/riv/aktivity
| - P(1P04LA235), P(KAN300100702), P(LC510), P(LC528), Z(AV0Z10100523), Z(AV0Z40400503)
|
http://linked.open...iv/cisloPeriodika
| |
http://linked.open...vai/riv/dodaniDat
| |
http://linked.open...aciTvurceVysledku
| |
http://linked.open.../riv/druhVysledku
| |
http://linked.open...iv/duvernostUdaju
| |
http://linked.open...titaPredkladatele
| |
http://linked.open...dnocenehoVysledku
| |
http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21460/07:12130223
|
http://linked.open...riv/jazykVysledku
| |
http://linked.open.../riv/klicovaSlova
| |
http://linked.open.../riv/klicoveSlovo
| |
http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
|
http://linked.open...ontrolniKodProRIV
| |
http://linked.open...i/riv/nazevZdroje
| |
http://linked.open...in/vavai/riv/obor
| |
http://linked.open...ichTvurcuVysledku
| |
http://linked.open...cetTvurcuVysledku
| |
http://linked.open...vavai/riv/projekt
| |
http://linked.open...UplatneniVysledku
| |
http://linked.open...v/svazekPeriodika
| |
http://linked.open...iv/tvurceVysledku
| - Chalupský, Jaromír
- Hau-Riege, S. P.
- Juha, L.
- Krzywinski, J.
- Chapman, H.
- Jurek, M.
- Kuba, Jaroslav
- Pelka, J. B.
- Sobierajski, R.
- Tiedtke, K.
- Toleikis, S.
- Tschentscher, T.
- Wabnitz, H.
- Bergh, M.
- Caleman, C.
- Hajdu, J.
- Cihelka, J.
- London, R. A.
- Zastrau, U.
- Velyhan, A.
- Sokolowski-Tinten, K.
- Krasa, J.
- Stojanovic, N.
- Bionta, R. M.
- Hajkova, V.
- Koptyaev, S.
- Meyer-ter-Vehn, J.
- Nietubyc, J.
- Tronnier, A.
|
http://linked.open...n/vavai/riv/zamer
| |
issn
| |
number of pages
| |
http://localhost/t...ganizacniJednotka
| |