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Description
| - t the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si=C multilayers with fluxes up to 3 1014 W=cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3A°. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, giving credence to the concept of diffraction imaging of single macromolecules.
- t the recently built FLASH x-ray free-electron laser, we studied the reflectivity of Si=C multilayers with fluxes up to 3 1014 W=cm2. Even though the nanostructures were ultimately completely destroyed, we found that they maintained their integrity and reflectance characteristics during the 25-fs-long pulse, with no evidence for any structural changes over lengths greater than 3A°. This experiment demonstrates that with intense ultrafast pulses, structural damage does not occur during the pulse, giving credence to the concept of diffraction imaging of single macromolecules. (en)
- Měření interakcí ultrarychlých rentgenových bezelektronových laserových pulsů s hmotou v subnanometrickém měřítku. (cs)
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Title
| - Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter
- Měření interakcí ultrarychlých rentgenových bezelektronových laserových pulsů s hmotou v subnanometrickém měřítku (cs)
- Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter (en)
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skos:prefLabel
| - Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter
- Měření interakcí ultrarychlých rentgenových bezelektronových laserových pulsů s hmotou v subnanometrickém měřítku (cs)
- Subnanometer-Scale Measurements of the Interaction of Ultrafast Soft X-Ray Free-Electron-Laser Pulses with Matter (en)
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skos:notation
| - RIV/68407700:21460/07:12130214!RIV08-AV0-21460___
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21460/07:12130214
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
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http://linked.open.../riv/klicoveSlovo
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| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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| - Virtual Journal of Nanoscale Science & Technology
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http://linked.open...in/vavai/riv/obor
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| - Hau-Riege, S. P.
- Juha, L.
- Krzywinski, J.
- Kuba, Jaroslav
- Sobierajski, R.
- Toleikis, S.
- Tschentscher, T.
- Bajt, S.
- Bergh, M.
- Caleman, C.
- Chapman, H. N.
- London, R. A.
- Sokolowski-Tinten, K.
- Stojanovic, N.
- Nietubyc, R.
- Baker, S.
- Bionta, R.
- Gullikson, E.
- Kjornrattanawanich, B.
- Plönjes, E.
- Spiller, E.
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http://localhost/t...ganizacniJednotka
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